2013
DOI: 10.1088/0022-3727/46/13/139601
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Erratum: Basic principles of STT-MRAM cell operation in memory arrays

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Cited by 85 publications
(103 citation statements)
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“…In ref. 3,11 , this energy is written 4 A ex K disk eff d t mag where A ex is the exchange stiffness and K disk eff the effective anisotropy of the disk. These expressions assume that the disk is larger than the domain wall i.e.…”
mentioning
confidence: 99%
“…In ref. 3,11 , this energy is written 4 A ex K disk eff d t mag where A ex is the exchange stiffness and K disk eff the effective anisotropy of the disk. These expressions assume that the disk is larger than the domain wall i.e.…”
mentioning
confidence: 99%
“…In the p-MTJ spin-valve (stack A), the MgO tunneling barrier exhibited a combined layer of fcc (100) crystals (i in Figure 3a) and an amorphous layer (ii in Figure 3a), and both the Co 2 Fe 6 B 2 free and pinned layers were revealed to be amorphous layers (iii and iv in Figure 3a), thereby remarkably reducing the Δ1 coherent tunneling of the MgO tunneling barrier, which in turn greatly decreased the TMR ratio of the p-MTJ spin-valves. 34 In contrast, in the p-MTJ spin-valve (stack B), the MgO tunneling barrier showed an almost complete fcc (100)-crystalized layer (i in Figure 3b). In addition, the Co 2 Fe 6 B 2 free layer appeared as a locally body-centered-cubic-crystalized layer (ii in Figure 3b), whereas the Co 2 Fe 6 B 2 pinned layer appeared as an almost amorphous layer (iii in Figure 3b).…”
Section: Resultsmentioning
confidence: 93%
“…Such films are used for decades in mass storage technologies, both as medium and in read-out devices [10]. The emerging applications of such films in electronics include spinbased computing [11] and very high density magnetic RAM-type memories [12,13]. For several years now there is growing interest in utilizing magnetic domain walls (DWs) in patterned and continuous thin films, both in electronics and biochemistry.…”
Section: Introductionmentioning
confidence: 99%