1987
DOI: 10.1063/1.98127
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Erbium doping of molecular beam epitaxial GaAs

Abstract: The doping of molecular beam epitaxial GaAs with erbium up to a concentration of 2x10E19 cm-3 has been successfully demonstrated. Up to a concentration of about 5x10E18 cm-3 the surface morphology remained good but for higher doping levels the surface became structured. Hall and profile measurements indicate that erbium doping gives rise to a trapping level capable of compensating silicon-doped layers. For the first time photoluminescence from a rare earth element incorporated in a III-V semiconductor has been… Show more

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Cited by 75 publications
(16 citation statements)
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“…Erbium is of particular interest because it has a characteristic emission at 1.54pm which is near to the minimum absorption window of silica-based optical fibres. A wide variety of 1 2 experimental techniques, including liquid phase epitaxy (LPE)1, ion implantation2, metal or4ganic chemical vapour deposition (MOCVD) 3 and molecular beam epitaxy (MBE) 4 '., have been employed to incorporate erbium into the binary semiconductor gallium arsenide. For the latter technique, optimum growth conditions and erbium concentrations for maximum luminescence efficiency have been deduced 4 , but few structural studies have been undertaken.…”
Section: Introductionmentioning
confidence: 99%
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“…Erbium is of particular interest because it has a characteristic emission at 1.54pm which is near to the minimum absorption window of silica-based optical fibres. A wide variety of 1 2 experimental techniques, including liquid phase epitaxy (LPE)1, ion implantation2, metal or4ganic chemical vapour deposition (MOCVD) 3 and molecular beam epitaxy (MBE) 4 '., have been employed to incorporate erbium into the binary semiconductor gallium arsenide. For the latter technique, optimum growth conditions and erbium concentrations for maximum luminescence efficiency have been deduced 4 , but few structural studies have been undertaken.…”
Section: Introductionmentioning
confidence: 99%
“…A wide variety of 1 2 experimental techniques, including liquid phase epitaxy (LPE)1, ion implantation2, metal or4ganic chemical vapour deposition (MOCVD) 3 and molecular beam epitaxy (MBE) 4 '., have been employed to incorporate erbium into the binary semiconductor gallium arsenide. For the latter technique, optimum growth conditions and erbium concentrations for maximum luminescence efficiency have been deduced 4 , but few structural studies have been undertaken. Using MBE we have grown and undertaken detailed structural characterisation of gallium arsenide doped with erbium in the range 4 x 101 6 cm 3 to 2 x 1020 cm3.…”
Section: Introductionmentioning
confidence: 99%
“…Much better quality samples of Er doped III-V semiconductors are grown by MOCVD [3,36] or MBE [37,38]. In a direct growth of doped layers all problems related to the post-implantation annealing are avoided.…”
Section: 3 Erbium In Gaasmentioning
confidence: 99%
“…Optical activity of Er disappeared entirely after the Er atoms had located in the lattice sites of GaAs. This effect may be associated either with the removal of defects activating photoluminescence of Er or with a change of bonding character between erbium or arsenic atoms, when the Er atoms tend to occupy tetrahedral lattice sites.Much better quality samples of Er doped III-V semiconductors are grown by MOCVD [3,36] or MBE [37,38]. In a direct growth of doped layers all problems related to the post-implantation annealing are avoided.…”
mentioning
confidence: 99%
“…Typically, the IR transitions seen from RE elements represent the lowest energy transition possible between 4f levels. Er incorporated into Si 2,3,4,5 or GaAs 6,7,8,9 has been the most commonly studied system, with its characteristic emission only well documented at infrared wavelengths.…”
Section: Introductionmentioning
confidence: 99%