Articles you may be interested inGrowth behavior of copper metalorganic chemical vapor deposition using the (hfac)Cu(VTMOS) precursor on titanium nitride substrates High resolution electron energy loss spectroscopy study of vapor deposited pyromellitic dianhydride and oxydianiline films on Cu(110) J. Vac. Sci. Technol. A 14, 3174 (1996); 10.1116/1.580209Ion-surface interactions in low temperature silicon epitaxy by remote plasma enhanced chemical-vapor deposition J.Low temperature deposition of silicon nitride films by distributed electron cyclotron resonance plasma-enhanced chemical vapor deposition From a standpoint of physical, chemical, and electrical properties, silicon nitride films formed by synchrotron radiation-excited chemical vapor deposition with SiH 4 ϩN 2 gas mixture are characterized. These properties are compared with the properties of films deposited by other low-temperature processes. It is found that the present film has such features as lower hydrogen content ͑Ͻ4ϫ10 21 cm Ϫ3 ͒, higher film density ͑2.9-3.05 g/cm 3 ͒, lower etching rate against BHF ͑Ͻ10 nm/min͒, and potentially improved electrical properties considering that deposition was performed at substrate temperatures as low as 200°C. Deposition kinetics, the effect of bias on film properties, and ways to improve the electrical properties are also discussed.