1993
DOI: 10.1016/0022-0248(93)90710-e
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Epitaxial growth of Co films and Co/Cu superlattices on sapphire substrates with and without buffer layers

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Cited by 30 publications
(6 citation statements)
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“…The procedure for growing Nb films of high structural quality is well established, and has been reported in several places. 11,12 The sapphire substrates had a miscut of less than 1°, and were of high crystalline quality with mosaicities between 0.002°and 0.006°. The Nb deposition was carried out in a Riber EVA 32 MBE machine under ultrahigh vacuum ͑UHV͒ conditions ͑base pressure better than 2ϫ10 Ϫ9 Pa͒ working pressure 10 Ϫ8 Pa. After chemically etching and rinsing in acetone and isopropanol, the substrates were transferred into the UHV system.…”
Section: Sample Preparation and Experimental Proceduresmentioning
confidence: 99%
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“…The procedure for growing Nb films of high structural quality is well established, and has been reported in several places. 11,12 The sapphire substrates had a miscut of less than 1°, and were of high crystalline quality with mosaicities between 0.002°and 0.006°. The Nb deposition was carried out in a Riber EVA 32 MBE machine under ultrahigh vacuum ͑UHV͒ conditions ͑base pressure better than 2ϫ10 Ϫ9 Pa͒ working pressure 10 Ϫ8 Pa. After chemically etching and rinsing in acetone and isopropanol, the substrates were transferred into the UHV system.…”
Section: Sample Preparation and Experimental Proceduresmentioning
confidence: 99%
“…More recently, Weidinger and his group reported a solubility study of H in epitaxial Nb͑110͒ films of different thickness. 5 The H concentration was determined in situ by the resonant nuclear reaction 1 H( 15 N,␣␥) 12 C method. From these measurements they concluded that the metal-hydrogen interaction is essentially the same as in the bulk, and that the H-H interaction is reduced by at least a factor of 2.…”
Section: Introductionmentioning
confidence: 99%
“…[23] In addition, the crystal structure can be stable initially as the fcc phase and transform to the hcp phase with increasing thickness. [24] The layers grown by MOCVD in the present study were analyzed by X-ray diffraction and a typical X-ray diffrac- Table 1. Summary of the precursors used for MOCVD of cobalt/cobalt silicide.…”
mentioning
confidence: 99%
“…The procedure for growing Nb films of high structural quality is well established and has been reported at several places [7,17,18]. Nb was evaporated with an electron beam gun at a substrate temperature of 900 ± C. In situ reflection high energy electron diffraction (RHEED) confirmed a very smooth growth of the Nb films [17]. Subsequently, a Pd film with [111] orientation and about 2 nm thickness was deposited on the Nb surface.…”
mentioning
confidence: 99%