2008
DOI: 10.1016/j.tsf.2008.07.003
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Epitaxial growth of Al–Cr–N thin films on MgO(111)

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Cited by 16 publications
(6 citation statements)
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References 30 publications
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“…2 shows the dependence of the lattice parameter a of the cubic phase on the overall AlN content in comparison to the ab initio obtained dependence [11]. The lattice parameters of c-Cr 1 − x Al x N on cemented carbide substrates decrease with increasing AlN content and are 4.155, 4.153, 4.143, and 4.108 Å for x = 0, 0.21, 0.45, and 0.71, respectively, and correspond to earlier reports of c-Cr 1 − x Al x N coatings [6,[13][14][15][16][17][18][19].…”
Section: Resultssupporting
confidence: 87%
“…2 shows the dependence of the lattice parameter a of the cubic phase on the overall AlN content in comparison to the ab initio obtained dependence [11]. The lattice parameters of c-Cr 1 − x Al x N on cemented carbide substrates decrease with increasing AlN content and are 4.155, 4.153, 4.143, and 4.108 Å for x = 0, 0.21, 0.45, and 0.71, respectively, and correspond to earlier reports of c-Cr 1 − x Al x N coatings [6,[13][14][15][16][17][18][19].…”
Section: Resultssupporting
confidence: 87%
“…For Ti 0.54 Al 0.46 N, a significant difference in the coherence length value is observed between 111 and 200 cubic domains, 258 Å and 140 Å , respectively. Those values are obviously five to ten times lower than for epitaxically grown metallic nitride layers of rock salt structure (Willmann et al, 2008). Fig.…”
Section: Characterization Methodsmentioning
confidence: 75%
“…is chosen which has shown that they can improve CrN thermal stability as well as mechanical properties. 136,147,[162][163][164][165][166][167][168][169] Despite the fact that the mechanical properties of CrN has been well studied. The electrical properties of CrN are still controversial with conclusion varying from report to report.…”
Section: Review Of Chromium Nitride (Crn)mentioning
confidence: 99%