The shape of the empirical incorporation characteristic of phosphorus in epitaxial silicon, deposited from silane-phosphine-hydrogen mixtures, shows two branches with different incorporation dependences on temperature (incorporation enthalpies). I n the lower phosphorus-concentration range ( NPsf < 10l8) the experimentally determined value of incorporation enthalpy can be explained as a complex quantity, including the enthalpies of the two phosphorus hydrides PH, and PH,, the latter of which is formed by the partial decomposition of phosphine (PH,) a t deposition temperatures.