Entropy-driven parity-tree selection for low-overhead concurrent error detection in finite state machines

A concurrent BIST scheme for read only memories

“…[3], [7]) by exploiting the decoding structure of the ROM. In the sequel we shall present the design of the decoder used in the ROM and its exploitation for the proposed scheme.…”

“…Input vector monitoring concurrent BIST techniques [2]- [7] have been proposed to avoid this performance degradation. These architectures test the Circuit Under Test (CUT) concurrently with its normal operation by exploiting input vectors appearing to the inputs of the CUT; if the incoming vector belongs to a set called active test set, the Response Verifier is enabled to capture the CUT response.…”

“…These techniques can operate in either normal or test mode. The Concurrent Test Latency (CTL) of an input vector monitoring scheme is the mean time (counted either in number of clock cycles or time units) required to complete the test while the CUT operates in normal mode.In this work we present a novel input vector monitoring concurrent BIST scheme that is particularly suited for ROMs; the scheme compares favorably to previously proposed schemes [2]- [7] with respect to the hardware overhead / concurrent test latency tradeoff.…”

SAT-based ATPG beyond stuck-at fault testing

“…During code definition and the synthesis of the prediction logic additional objectives can be followed: For example, concurrent error detection with parity codes has been extended to fault diagnosis and error correction [1], and the approaches in [2] and [19] target a low power implementation. Some other techniques try to detect just as many errors as possible at lower overhead.…”

“…As the checker must be self-checking, cascadable two-rail checkers with six logic gates may be used to build the checker for parity groups [27]. As the results in [9] show, the resulting circuit is fault secure with an area overhead which is significantly lower than the overhead for the approaches reported in the literature so far [2,31].…”