Entropy-Based Optimum Test Points Selection for Analog Fault Dictionary Techniques

Starzyk, Janusz A.; Liu, Dong; Liu, Zhihong; Nelson, Dale E.; Rutkowski, Jerzy

doi:10.1109/tim.2004.827085

Cited by 115 publications

(90 citation statements)

References 17 publications

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“…The leapfrog filter circuit in Fig.5 is from [18]. All the resistors are 10 kW , and capacitor 1 C and 4 C are 0.01 F m , and capacitors 2 C and 3 C are 0.02 F m . The leapfrog filter is a kind of low pass filter, which is based on MITEL semiconductor's complementary metaloxide-semiconductor (CMOS) technology.…”

Section: Simulation 1-leapfrog Filter Circuitmentioning

confidence: 99%

“…Testability of analog circuits has become more important recently due to the rapid development in analog VLSI chips, mixed-signal systems, and system-on-chip (SoC) products [1]- [3]. Since complete testing of an analog circuit specification can be costly, sometimes impossible, analyzing the output response of the circuit under test (CUT), which is called signature analysis, is the key to successful application of defected-oriented testing for high fault and yield coverage [4].…”

Section: Introductionmentioning

confidence: 99%

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Kalman Filter Based Method for Fault Diagnosis of Analog Circuits

Xie¹,

Bi²,

Ao³

2013

Metrology and Measurement Systems

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This paper presents a Kalman filter based method for diagnosing both parametric and catastrophic faults in analog circuits. Two major innovations are presented, i.e., the Kalman filter based technique, which can significantly improve the efficiency of diagnosing a fault through an iterative structure, and the Shannon entropy to mitigate the influence of component tolerance. Both these concepts help to achieve higher performance and lower testing cost while maintaining the circuit's functionality. Our simulations demonstrate that using the Kalman filter based technique leads to good results of fault detection and fault location of analog circuits. Meanwhile, the parasitics, as a result of enhancing accessibility by adding test points, are reduced to minimum, that is, the data used for diagnosis is directly obtained from the system primary output pins in our method. The simulations also show that decision boundaries among faulty circuits have small variations over a wide range of noise-immunity requirements. In addition, experimental results show that the proposed method is superior to the test method based on the subband decomposition combined with coherence function, arisen recently.

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Section: Simulation 1-leapfrog Filter Circuitmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Kalman Filter Based Method for Fault Diagnosis of Analog Circuits

Xie¹,

Bi²,

Ao³

2013

Metrology and Measurement Systems

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“…Usually, bridging faults induce an elevated I DDQ current. Consequently these faults can be easily detected using a Built In Current Sensor (BICS) [1][2][3][4][5][6][7][8][9]. On the other side, open circuit faults, may decrease or cause only a small rise in I DDQ current that can not be detected by the built in current sensor.…”

Section: Physical Defects In Cmos Analog Integrated Circuitsmentioning

confidence: 99%

A Fault Dictionary-Based Fault Diagnosis Approach for CMOS Analog Integrated Circuits

Karmani¹,

Khedhiri²,

Hamdi³

et al. 2011

VLSICS

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“…One of the main problems in diagnostics is testability (Huertas, 1993), which relies on optimal test point selection (Prasad and Babu, 2000;Starzyk et al, 2004;Golonek and Rutkowski, 2007), including stimulus parameters and features of the output signals (Grzechca et al, 2007;Grasso et al, 2007).…”

mentioning

confidence: 99%

“…For test point optimization, the entropy measure (Starzyk et al, 2004) and the genetic algorithm have been used. The optimization of the input signal is also performed: in the time (Golonek et al, 2008) and the frequency domain (Sen and Saeks, 1979;Grzechca et al, 2007).…”

mentioning

confidence: 99%

Automatic parametric fault detection in complex analog systems based on a method of minimum node selection

Bilski

Wojciechowski

2016

International Journal of Applied Mathematics and Computer Science

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The aim of this paper is to introduce a strategy to find a minimal set of test nodes for diagnostics of complex analog systems with single parametric faults using the support vector machine (SVM) classifier as a fault locator. The results of diagnostics of a video amplifier and a low-pass filter using tabu search along with genetic algorithms (GAs) as node selectors in conjunction with the SVM fault classifier are presented. General principles of the diagnostic procedure are first introduced, and then the proposed approach is discussed in detail. Diagnostic results confirm the usefulness of the method and its computational requirements. Conclusions on its wider applicability are provided as well.

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Entropy-Based Optimum Test Points Selection for Analog Fault Dictionary Techniques

Cited by 115 publications

References 17 publications

Kalman Filter Based Method for Fault Diagnosis of Analog Circuits

Kalman Filter Based Method for Fault Diagnosis of Analog Circuits

A Fault Dictionary-Based Fault Diagnosis Approach for CMOS Analog Integrated Circuits

Automatic parametric fault detection in complex analog systems based on a method of minimum node selection

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