2021
DOI: 10.1039/d1tc02703d
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Enhancement of electrical performance of atomic layer deposited SnO films via substrate surface engineering

Abstract: Atomic layer deposition (ALD) is a technique based on the surface reaction of precursors; thus, it strongly depends on the surface states of the substrate. We demonstrate significant changes in...

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Cited by 7 publications
(7 citation statements)
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“…The SnO films grown at 175, 200, and 225 °C show generally dense and smooth surface morphology, but slight differences in grain structure are observed with varying deposition temperature. At 225 °C, the SnO films possess almost indiscernible grain boundaries, which indicates that the (001) planes of the SnO crystallites are predominantly aligned parallel to the SiO 2 substrate . However, the SnO films grown at 175 and 200 °C exhibit elongated grains and distinct grain boundaries.…”
Section: Resultsmentioning
confidence: 99%
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“…The SnO films grown at 175, 200, and 225 °C show generally dense and smooth surface morphology, but slight differences in grain structure are observed with varying deposition temperature. At 225 °C, the SnO films possess almost indiscernible grain boundaries, which indicates that the (001) planes of the SnO crystallites are predominantly aligned parallel to the SiO 2 substrate . However, the SnO films grown at 175 and 200 °C exhibit elongated grains and distinct grain boundaries.…”
Section: Resultsmentioning
confidence: 99%
“…At 225 °C, the SnO films possess almost indiscernible grain boundaries, which indicates that the (001) planes of the SnO crystallites are predominantly aligned parallel to the SiO 2 substrate. 26 However, the SnO films grown at 175 and 200 °C exhibit elongated grains and distinct grain boundaries. This can be observed from the irregular and mixed alignment of the (001) layered plane, which causes more hole scattering at the grain boundaries, resulting in a low μ FE value.…”
Section: Resultsmentioning
confidence: 99%
“…[10] 최근 p-type 산화물 박막 합성을 위 해 spin coating, solution combustion synthesis, inkjet printing, sol-gel method 등의 용액 공정과 sputtering (스퍼터링) 법, atomic layer deposition (ALD, 원자층 증착법)이 주로 활용되고 있음이 조사 되었다. 아울러 성능 개선을 위해 시도된 이온 도핑 [17][18][19][20][21] , 상 비율제어 [22][23][24][25] , 계면/표면 제어 [26][27][28] , high-k dielectric 도입 [17,24,29] [36,38,52,53] NiO는 NaCl, MgO, 및 한 형태로 존재한다. [54] 이에 따라 hole의 유효질량이 줄 어들며 다른 oxide 박막보다 우수한 hole 이동도를 가질 수 있는 것이다.…”
Section: 서론unclassified
“…[38] 완성된 박막 트랜지스터 소자 2021년 이후 정공의 전계효과 이동도가 4 cm 2 /Vs 이 상인 논문들이 다수 보고되었다. [24,[44][45][46] 한양대 박진 성 교수 연구팀은 기존 SnO의 원자층 증착을 위해 주 로 활용되었던 bis(1-dimethylamino-2-methyl-2-propoxide)Sn [27,38,46,60] 전구체가 아닌 N,N′-tertbutyl-1,1-dimethylethylenediamine stannylene (II) 전구체를 활용하여 SnO를 합성한 연구결과를 발표 했다. [44,61] 팀이다.…”
Section: Snounclassified
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