2022
DOI: 10.1109/led.2021.3132192
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Enhancement-Mode Ga2O3 FET With High Mobility Using p-Type SnO Heterojunction

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Cited by 13 publications
(9 citation statements)
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“…In 2022, Wang et al. demonstrated that by forming a heterojunction between the p-type SnO and n-type β-Ga 2 O 3 nanomembrane, the V TH of the bottom-gate MOSFETs (SnO/β-Ga 2 O 3 /SiO 2 /p+ Si) can be increased from −40 V without SnO to ∼5 V with 12 nm SnO …”
Section: β-Ga2o3 Nanomembrane Fetsmentioning
confidence: 99%
See 1 more Smart Citation
“…In 2022, Wang et al. demonstrated that by forming a heterojunction between the p-type SnO and n-type β-Ga 2 O 3 nanomembrane, the V TH of the bottom-gate MOSFETs (SnO/β-Ga 2 O 3 /SiO 2 /p+ Si) can be increased from −40 V without SnO to ∼5 V with 12 nm SnO …”
Section: β-Ga2o3 Nanomembrane Fetsmentioning
confidence: 99%
“…128 In 2022, Wang et al demonstrated that by forming a heterojunction between the ptype SnO and n-type β-Ga 2 O 3 nanomembrane, the V TH of the bottom-gate MOSFETs (SnO/β-Ga 2 O 3 /SiO 2 /p+ Si) can be increased from −40 V without SnO to ∼5 V with 12 nm SnO. 129 Bottom-Gate MOSFETs. To effectively control the channels of the β-Ga 2 O 3 nanomembrane MOSFETs, i.e., to decrease the subthreshold slope (SS, mV/dec) of the MOSFET, various gating schemes have been investigated.…”
mentioning
confidence: 99%
“…Janghyuk Kim et al [6] demonstrated the realization of an E−mode quasi−two−dimensional Ga 2 O 3 FET with a novel graphene gate architecture via a van der Waals heterojunction. Xunxun Wang et al [32] fabricated SnO/Ga 2 O 3 p−n heterojunctions in the back channel, achieving enhancement−mode operation.…”
Section: Introductionmentioning
confidence: 99%
“…In this work, the Ta-doped β-Ga 2 O 3 single crystal has been grown using the OFZ method with high doping concentration. However, severe scattering at the metal–insulator–­semiconductor (MIS) interface is also a puzzle in the development of high-performance metal–insulator-semiconductor field-effect transistors (MISFETs), which is manifested as a decrease in carrier mobility . As is well-known, high carrier mobility is the key for β-Ga 2 O 3 -based field-effect transistors (FETs) in high power fields.…”
mentioning
confidence: 99%
“…However, severe scattering at the metal−insulator−semiconductor (MIS) interface is also a puzzle in the development of high-performance metal−insulator-semiconductor field-effect transistors (MISFETs), which is manifested as a decrease in carrier mobility. 10 As is well-known, high carrier mobility is the key for β-Ga 2 O 3 -based field-effect transistors (FETs) in high power fields. Kim et al fabricated a top-gate β-Ga 2 O 3 FET using hexagonal boron nitride (h-BN) with a thickness of 60 nm as the gate dielectric, which exhibits a mobility of 1.8 cm 2 /(V s).…”
mentioning
confidence: 99%