Enhanced resolution of reflection-mode near-field scanning optical microscope by detecting 2/sup nd/ harmonic signals

Park, June-Hyoung; Kim, M.R.; Jhe, Wonho

doi:10.1109/cleopr.1999.814724

Technical Digest. CLEO/Pacific Rim '99. Pacific Rim Conference on Lasers and Electro-Optics (Cat. No.99TH8464)

DOI: 10.1109/cleopr.1999.814724

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Enhanced resolution of reflection-mode near-field scanning optical microscope by detecting 2/sup nd/ harmonic signals

June-Hyoung Park¹,

M.R. Kim²,

Wonho Jhe³

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Enhanced resolution of reflection-mode near-field scanning optical microscope by detecting 2/sup nd/ harmonic signals

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