2021
DOI: 10.1039/d1ra02210e
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Enhanced reliability of phase-change memory via modulation of local structure and chemical bonding by incorporating carbon in Ge2Sb2Te5

Abstract: Charge density differences (CDDs) on Ge–C–Sb bonds in CGST(5%) and Ge–C–Sb in CGST(10%).

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Cited by 7 publications
(16 citation statements)
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“…The main reason for the smaller drift coefficient is the reduced resistance in the amorphous state, as reported by Lacaita group . Besides, the resistance drift in the amorphous state was evaluated in C-GST (5%) and C-GST (10%) recently . With the same operating voltage, the cyclability and resistance drift performance are continuously enhanced by doping more C in GST.…”
Section: Phase Transition For Electronic Nanodevicesmentioning
confidence: 89%
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“…The main reason for the smaller drift coefficient is the reduced resistance in the amorphous state, as reported by Lacaita group . Besides, the resistance drift in the amorphous state was evaluated in C-GST (5%) and C-GST (10%) recently . With the same operating voltage, the cyclability and resistance drift performance are continuously enhanced by doping more C in GST.…”
Section: Phase Transition For Electronic Nanodevicesmentioning
confidence: 89%
“…Doping impurities in semiconductors is a typical technique to control carrier densities, Fermi level, and other properties, widely used in configuring PCM to enhance memory cell performances. From the early 2000s, many dopants, including C, N, Cu, Ni, O, Ga, Ru, Sc, , BN, and SiC, have been used in GeSbTe or GeTe alloy with reported enhanced performance. Dopants can increase the disorder or form new types of bonds in amorphous states, leading to higher resistance and increased T c .…”
Section: Phase Transition For Electronic Nanodevicesmentioning
confidence: 99%
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