2017
DOI: 10.1063/1.4992791
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Enhanced radiation tolerance in Mn-doped ferroelectric thin films

Abstract: This work investigates the role of Mn-doping of ferroelectric lead zirconate titanate (PZT) thin films exposed to a range of ionizing radiation doses. PZT thin films were fabricated with both undoped and 4% Mn-doped compositions, and the functional response was compared both before and after exposure to gamma radiation doses up to 10 Mrad. A phenomenological model was applied to quantify defect interactions and compare trends in the degradation of the functional response. Mn-doped PZT samples demonstrate reduc… Show more

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Cited by 10 publications
(4 citation statements)
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“…The good performance of traditional perovskite-based ferroelectric memory (FeRAM) in extreme environments makes it promising for aerospace and nuclear applications. [8][9][10][11][12] Hence, the space applications of the emerging hafnium-based FeRAM are also of interest. It is necessary to systematically evaluate the radiation effects of its materials, devices, and circuits before its application.…”
mentioning
confidence: 99%
“…The good performance of traditional perovskite-based ferroelectric memory (FeRAM) in extreme environments makes it promising for aerospace and nuclear applications. [8][9][10][11][12] Hence, the space applications of the emerging hafnium-based FeRAM are also of interest. It is necessary to systematically evaluate the radiation effects of its materials, devices, and circuits before its application.…”
mentioning
confidence: 99%
“…The original polarization state of the materials could be restored by annealing to a few 100 • C (depending on the dose), which was related to the relaxation of radiation-induced defects [15][16][17][18]. Brewer et al noted that manganese doping of PZT films that resulted in a decreased polarization response compared to the undoped films enhanced their gamma-radiation tolerance for doses up to 10 5 Gy [19]. A phenomenological model has been proposed to relate measurable degradation of physical properties of functional oxides, including ferroelectrics, depending on the total ionization dose, notwithstanding the type of ionization [20].…”
Section: Introductionmentioning
confidence: 99%
“…Отличительной особенностью FRAM является зарядовый принцип записи, основанный на переключении поляризации в сегнетоэлектрическом конденсаторе, что обеспечивает энергонезависимость наряду с высокой энергоэффективностью, скоростями чтения/записи, большим числом циклов перезаписи (1012 -1015) и длительным временем хранения (~10 лет) [3][4][5]. Сегнетоэлектрические материалы отличаются также высокой стойкостью к воздействию специальных факторов, что определяет перспективы их применения в особых условиях эксплуатации [13][14][15].…”
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