Abstract:Atomic force microscopy (AFM) had and continues to have a substantial impact on nano-sciences and technologies. However, the low scanning speed continues to be one of the obstacles that impede the widespread adoption of AFM. This paper presents a solution to control system design issues for constant force contact AFM operation to enhance the performance of AFM systems with respect to scanning speed and image resolution. The purpose of the controller is to maintain a constant slope at the free end of the AFM ca… Show more
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