We performed temperature-dependent time-resolved optical studies (TRPL) on AlInGaN-based bluelight-emitting quantum well (QW) with different well widths. Radiative and non-radiative components of PL lifetime were analyzed by measuring intensity and lifetime of PL. We experimentally confirmed that a non-radiative lifetime was affected by internal field in InGaN QWs. Therefore, non-radiative lifetimes were reduced as a well width decreasing in the same way that radiative lifetimes do. In addition, the more efficient optical properties of QWs, such as internal quantum efficiency, were achieved in the narrow QWs rather than the wider one. 1 Introduction A progress in InGaN-based semiconductors technology has successfully achieved the manufacture of highly efficient laser diodes (LDs) [1]. In addition to operational wavelength of LDs from violet to blue spectral regions, bluish green (480 nm) and true-green (530 nm) emissions are demanded for bio-medical and display applications. However, a stable operation of LDs in relatively long wavelength region (> 470 nm) is suffering from a high threshold current and low slope efficiency, as well as an enormous blue-shift of emission wavelength under increasing input current [2]. In particular, an efficiency of InGaN quantum wells (QWs) is drastically reduced as emission wavelength increases in range from 450 nm to 520 nm. As a result, active medium can not provide enough gain to obtain threshold condition of LD.In InGaN-based band gap materials, a non-radiative recombination of carriers is an important process, which governs luminescence mechanism at room temperature [3]. In this report, we studied systematically a non-radiative life time in blue-green QWs so as to figure out the correlation between QW's efficiency in LDs and non-radiative process under the In-rich environment, which have the Quantum Confined Stark Effect (QCSE) induced by piezo-electric field and the highly localized potential due to In fluctuation in QWs.It is observed that PL lifetime is determined by radiative process in low T regime (< 100 K) but, in room temperature, non-radiative transition is almost 10 times faster than radiative one. Therefore, in room temperature, luminescence efficiency is governed by non-radiative recombination process related to point defects in a QW [3,4]. By compared between samples with different QW thicknesses, the radiative lifetimes are decreasing as QW thickness increasing, which is explained by the reduction of electronhole wavefunction overlap in the tilted potential induced by piezo-electric field rather than the increase of non-radiative recombination centers in the highly localized potential. In addition, we observe that nonradiative lifetimes are also decreasing with increasing well width in such a way that the variation of nonradiative lifetimes is influenced by piezo-electric effect as well. The change of non-radiative lifetime is