Enhanced Emission by Accumulated Charges at Organic/Metal Interfaces Generated during the Reverse Bias of Organic Light Emitting Diodes

Abstract

A high frequency rectangular alternating voltage was applied to organic light emitting diodes (OLEDs) with the structure ITO/TPD/Alq 3 /Al and ITO/CoPc/Alq 3 /Al, where ITO is indium-tin-oxide, TPD is 4,4 -bis[N-phenyl-N-(m-tolyl)amino]biphenyl, CoPc is cobalt phthalocyanine, and Alq 3 is Tris(8-quinolinolato)aluminum, and the effect on emission of the reverse bias was examined. The results reveal that the emission intensity under an alternating reverse-forward bias is greater than that under an alternating zero-forward bias. The difference in the emission intensity (∆I) increased both for decreasing frequency and increasing voltage level of the reverse bias. In particular, the change in emission intensity was proportional to the voltage level of the reverse bias given the same frequency. To understand ∆I, this paper proposes a model in which an OLED works as a capacitor under reverse bias, where positive and negative charges accumulate on the metal/organic interfaces. In this model, the emission enhancement that occurs during the alternating reverse-forward bias is rationalized as a result of the charge accumulation at the organic/metal interfaces during the reverse bias, which possibly modulates the vacuum level shifts at the organic/metal interfaces to reduce both the hole injection barrier at the organic/ITO interface and the electron injection barrier at the organic/Al interface under forward bias.

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