2002
DOI: 10.1063/1.1528730
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Enhanced absorption and quantum efficiency in locally modified single-crystal Si

Abstract: The experimental collection efficiency of a nanoscale Si-layered system formed around a buried amorphization is investigated. A self-consistent calculation that takes into account the number of photons removed in the front deactivated zone and those transmitted to deeper layers leads to the result that more than one electron per absorbed short-wavelength photon is collected in the active zone lying below a carrier collection limit. This result suggests that it could be possible to make an efficient third gener… Show more

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Cited by 23 publications
(22 citation statements)
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“…To create an appropriate band bending for the effective minority carrier collection and the interface recombination control, a highly doped AL was utilized [12]. The barrier structure of a modified emitter was treated as the -Si-+ -Si--Si or -Si-+ --Si--Si heterojunction, blocking the flow of minority carriers generated between the front surface of the emitter and the upper interface of AL [11,12]. The insertion of a similar structure in the space charge region is believed to be preferable, because a better control of recombination can be achieved, if the built-in potential of the -junction drops on the layer volume (that means that the electric field in AL is about 10 6 V/cm).…”
Section: Related Experimental Results and Future Developmentmentioning
confidence: 99%
“…To create an appropriate band bending for the effective minority carrier collection and the interface recombination control, a highly doped AL was utilized [12]. The barrier structure of a modified emitter was treated as the -Si-+ -Si--Si or -Si-+ --Si--Si heterojunction, blocking the flow of minority carriers generated between the front surface of the emitter and the upper interface of AL [11,12]. The insertion of a similar structure in the space charge region is believed to be preferable, because a better control of recombination can be achieved, if the built-in potential of the -junction drops on the layer volume (that means that the electric field in AL is about 10 6 V/cm).…”
Section: Related Experimental Results and Future Developmentmentioning
confidence: 99%
“…After layer growth, their concentration increased drastically. Does this indicate a new generation mechanism [11] visualized by optical and optoelectronic characterizations?…”
Section: Analysis: Free-carrier Absorptionmentioning
confidence: 97%
“…This layered nanosystem buried within the emitter is at the origin of a spatial carrier collection limit (CCL) [11], which permits a clear separation of optical and electronic effects. This means that a free carrier surface reservoir (delimited by the Si surface and a buried crystalline/amorphous (c-Si/a-Si) interface), activated under illumination, represents a dead zone (d z ) for carrier collection.…”
Section: Test Devicementioning
confidence: 99%
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“…The ns-Si-ls was formed by ion-beam implantation and adequate thermal treatment [12]. It contains a free-carrier surface reservoir, which is delimited by the Si surface and a buried c-Si/a-Si interface (determined by a valence band offset) [13].…”
Section: Optical Features Of the Nanoscale Si-layered Systemmentioning
confidence: 99%