2017
DOI: 10.1557/jmr.2017.108
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Engineering solar cells based on correlative X-ray microscopy

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Cited by 62 publications
(80 citation statements)
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References 133 publications
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“…[106] Depending on the solar cell that is being characterized, charge separation occurs by an internal p-n junction or due to the charge-carriers collected by the selective contacts. Both of these techniques measure current, and in the case of XBIC, this is proportional to the number of absorbed X-ray photons.…”
Section: X-ray Beam Induced Currentmentioning
confidence: 99%
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“…[106] Depending on the solar cell that is being characterized, charge separation occurs by an internal p-n junction or due to the charge-carriers collected by the selective contacts. Both of these techniques measure current, and in the case of XBIC, this is proportional to the number of absorbed X-ray photons.…”
Section: X-ray Beam Induced Currentmentioning
confidence: 99%
“…This method showed the relation between the material composition and electronic performance for perovskite thin-films for the first time. [106] Therefore, stoichiometry changes in the film can be related and measured in parallel with charge collection efficiency. XBIC current measures were taken at the same time as XRF scans; degradation in the XBIC data was observed because of the X-ray beam intensity.…”
Section: Halide Heterogeneity and Stoichiometrymentioning
confidence: 99%
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