Engineering a square truncated lattice with light's orbital angular momentum

Mesquita, Pedro H. F.; Jesus‐Silva, Alcenísio J.; Fonseca, E. J. S.; Hickmann, Jandir M.

doi:10.1364/oe.19.020616

Cited by 37 publications

(16 citation statements)

References 15 publications

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“…It is possible to decide if the pattern corresponds to an even or odd value of the TC observing the central region of each pattern. This difference in the pattern formation have been explained previously [20].…”

supporting

confidence: 59%

“…Particularly interesting is the rich relationship between the phase of light with OAM and diffraction phenomena [9,10,[16][17][18][19][20]. This relationship was well explored by a very simple experiment performed by Hickmann et al [10].…”

mentioning

confidence: 99%

“…Other applications of light's OAM range from optical manipulation [11] to quantum communication [12,13]. Two recent publications show the importance of this subject applied to optical communications [14] and quantum metrology [15].Particularly interesting is the rich relationship between the phase of light with OAM and diffraction phenomena [9,10,[16][17][18][19][20]. This relationship was well explored by a very simple experiment performed by Hickmann et al…”

mentioning

confidence: 99%

“…In [20], results of diffraction of light with OAM by a square aperture were presented. The authors showed numerically and experimentally that a perfect square optical intensity lattice takes place only for even values of the TC.…”

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Unveiling square and triangular optical lattices: a comparative study

et al. 2014

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We study square and triangular optical lattice formation using a diffraction technique with light-possessing orbital angular momentum (OAM). We demonstrate that it is possible to use Fraunhofer diffraction of light by a square aperture to unveil OAM about two times bigger than would be possible with a triangular aperture. We notice that the pattern remains truncated until a topological charge (TC) equal to 20 with good precision. Even though a square pattern cannot be used to determine the TC sign, it is possible to measure high order of the modulus and sign of the TC up to 20, combining patterns of the triangular and square apertures. [4][5][6][7] and diffraction phenomena [8][9][10]. Other applications of light's OAM range from optical manipulation [11] to quantum communication [12,13]. Two recent publications show the importance of this subject applied to optical communications [14] and quantum metrology [15].Particularly interesting is the rich relationship between the phase of light with OAM and diffraction phenomena [9,10,[16][17][18][19][20]. This relationship was well explored by a very simple experiment performed by Hickmann et al.[10]. The basic idea is to observe the Fraunhofer pattern of a diffracted light with OAM by a triangular slit or triangular aperture with the phase singularity aligned on the center of these objects. A truncated triangular optical lattice in the Fraunhofer plane is observed. The size of this optical lattice depends on the amount of OAM, and by counting the number of intensity maxima N of any extern side of the triangular lattice you can obtain the value of TC, m, using a very simple rule, m N − 1. A simple way to understand the formation of this pattern is to observe the diffraction of light with OAM due to each edge of the aperture separately in Fraunhofer plane. Two points must be observed: firstly, the number of fringes due to each edge is proportional to the OAM value, and second, the effect of the azimuthal phase over this diffraction pattern produces a shift proportional to the amount of OAM. By interfering the light diffracted by the three edges, a triangular optical lattice is unveiled. In fact, in [9] the authors showed a detailed study of the diffraction problem of light with OAM by a single slit.They considered two situations where the phase singularity of the light beam strikes on the center of and above a single slit. In the latter case, which is the case for one side of the triangular aperture, the patterns observed are asymmetric and shifted.At this point a very simple question arises: What can we learn about diffracting OAM beam by other polygonal shapes? In [20], results of diffraction of light with OAM by a square aperture were presented. The authors showed numerically and experimentally that a perfect square optical intensity lattice takes place only for even values of the TC.In this Letter, we show a comparative study of the diffraction problem of light with OAM between square and triangular shape. Surprisingly, with a square aperture the value of TC obtai...

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confidence: 59%

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confidence: 99%

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confidence: 99%

mentioning

confidence: 99%

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Unveiling square and triangular optical lattices: a comparative study

et al. 2014

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“…When a square-slit is employed, a quasi-square optical lattice will be unveiled and the arrangement of lattice can be modulated by the OAM beam. The two kinds of interferences indicate the traditional interferences can also be realized on two-dimensional micro-sized metallic thin film, and show great potential for super-resolution microscopy [9,10], OAM detection [8,[11][12][13] and spot array generation [14,15]. [17].…”

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Double-Slit and Square-Slit Interferences With Surface Plasmon Polaritons Modulated by Orbital Angular Momentum Beams

Zhou

Zhang

et al. 2015

IEEE Photonics J.

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We present two kinds of interferences on metallic thin films with orbital angular momentum (OAM) beams, namely double-slit interference and square-slit interference. When an OAM beam is normally incident upon the metallic thin film with two slits, the fringes on the metallic thin film generated by the interference of two surface plasmon polariton (SPP) waves will twist, and the twist amount depends on the topological charge of the incoming OAM beam. When a square-slit is employed, a quasi-square optical lattice will be unveiled and the arrangement of lattice can be modulated by the OAM beam. The fringes and spots are both subwavelength level, which show great potential for super-resolution microscopy, OAM detection and spot array generation.

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