1992
DOI: 10.1016/0168-583x(92)95400-l
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Energy spectroscopy studies of radiation-induced damaged surfaces and interfaces in SiO2/Si by light charged particles

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Cited by 8 publications
(1 citation statement)
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“…As reported in these papers [4][5][6][7][8], the photovoltaic characteristic of SIS solar cells has a strong dependence on the intermediate oxidation layer, which can act as passivity layer, tunneling function layer or inversion layer. Therefore, it is very important to determine the microstructure and property of this ultra-thin layer.…”
Section: Introductionmentioning
confidence: 97%
“…As reported in these papers [4][5][6][7][8], the photovoltaic characteristic of SIS solar cells has a strong dependence on the intermediate oxidation layer, which can act as passivity layer, tunneling function layer or inversion layer. Therefore, it is very important to determine the microstructure and property of this ultra-thin layer.…”
Section: Introductionmentioning
confidence: 97%