2017
DOI: 10.1016/j.apsusc.2017.04.122
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A concise way to estimate the average density of interface states in an ITO–SiO x /n-Si heterojunction solar cell

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Cited by 8 publications
(3 citation statements)
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“…In recent years, we devoted to researching advanced electronic materials as the hole-selective passivation layer of the indium tin oxide (ITO)/n-Si structure solar cell. Fortunately, the accompanying a-SiO x (In) layer was formed during sputtering of ITO film on the n-Si substrate, which played multiple roles including induced inversion layer, interface passivation, hole selective, and hole tunneling. , The ITO/n-Si solar cell obtained a V oc of 540 mV and an efficiency of 12.2%. However, the V oc was limited by a built-in field, which was essentially confined by the work-function difference between ITO (5.06 eV) film and n-Si (4.31 eV) bulk .…”
Section: Introductionmentioning
confidence: 99%
“…In recent years, we devoted to researching advanced electronic materials as the hole-selective passivation layer of the indium tin oxide (ITO)/n-Si structure solar cell. Fortunately, the accompanying a-SiO x (In) layer was formed during sputtering of ITO film on the n-Si substrate, which played multiple roles including induced inversion layer, interface passivation, hole selective, and hole tunneling. , The ITO/n-Si solar cell obtained a V oc of 540 mV and an efficiency of 12.2%. However, the V oc was limited by a built-in field, which was essentially confined by the work-function difference between ITO (5.06 eV) film and n-Si (4.31 eV) bulk .…”
Section: Introductionmentioning
confidence: 99%
“…The clarification of the interfacial physical mechanism of the MSHJ solar cells enabled a better understanding of the nature of device physics. We investigated an a-SiO x (In) interlayer that formed naturally between ITO and an n-Si substrate [17,22,[25][26][27] during the growth of an ITO film on an n-Si wafer. The a-SiO x (In) interlayer also played multiple roles in the ITO/n-Si heterojunction solar cell and helped produce an outstanding photovoltaic performance.…”
Section: Resultsmentioning
confidence: 99%
“…Moreover, the reflection and the absorption at the front surface were extracted from data measured with an ultraviolet-visible spectrophotometer. The average density of state for the interfacial layer was set to 1:2 × 10 11 eV −1 ‧cm −2 , which was measured with the special cyclic voltammetry technique reported in our previous work [17]. Carrier transport across the a-SiO x (Mo)/c-Si interface was described by a thermionic emission model with active tunneling at the interface.…”
Section: Simulation Modelmentioning
confidence: 99%