Abstract:Abstract. 2014 A theory is proposed to include the effects of valence excitations in electron image simulations for high-resolution electron microscopy (HREM) based on the single inelastic scattering model. Under the small thickness approximation, this general theory reduces to the simplified theory of perfectly delocalized inelastic scattering model, in which the image can be considered to be an incoherent sum of those incident electrons of different energies weighted by the intensity distribution in the ele… Show more
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