2006
DOI: 10.1063/1.2266888
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Energy distribution of O− ions during reactive magnetron sputtering

Abstract: Low, medium, and high energy O− ion populations were experimentally detected during magnetron sputtering of Al in an Ar∕O2 atmosphere. Based on calculations, the authors propose that nonsputtered O− ions originating from the target surface are accelerated in the cathode fall, while sputtered O− ions may be excluded as a significant contribution to the high energy ion population. Furthermore, the formation of medium energy O− ions is consistent with the notion of sputtered, in the cathode fall accelerated, and … Show more

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Cited by 84 publications
(56 citation statements)
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“…For example, thin-film growth of oxides often yields energetic negative oxygen ions [134,135,136,137,138,139,140,141,142,143].…”
Section: 31)mentioning
confidence: 99%
“…For example, thin-film growth of oxides often yields energetic negative oxygen ions [134,135,136,137,138,139,140,141,142,143].…”
Section: 31)mentioning
confidence: 99%
“…On the contrary, few works deal with negative ion surface-production in cesium-free plasmas 41,42,43,44,45,46,47,48,49,50,51,52,53,54,55,56,57,58,59,60,61,62,63,64,65,66,67,68 . Most of them are related to the industrial process of layer deposition by sputtering and concern mainly oxygen negative ions [44][45][46][47][48][49][50][51][52][53][54][55][56][57][58][59]. H-surface-production in Cs-free plasmas has been mainly studied in 59, 60, 61, 62 (carbon materials), 63 (stainless steel), and 64,65,66,67,68 (barium surfaces).…”
Section: A-introductionmentioning
confidence: 99%
“…Such ions, produced in the cathode fall region and arriving on the growth surface with a kinetic energy corresponding to the potential just in front of the cathode (maximal 250-300 V in our case [3]), appear to play a role in the formation of the structure of growing (oxide) films [23][24][25][26][27]. A hypothesis could be that with increasing O 2 partial pressure, and thus with increasing x-value, the flux of the energetic O À increases [27,5].…”
Section: Argonmentioning
confidence: 99%