Energy‐dispersive measurement and comparison of different spectra from diffraction x‐ray tubes

Görgl, R.; Wobrauschek, P.; Streli, Christina; Aiginger, H.; Benedikt, Martin

doi:10.1002/xrs.1300240403

Cited by 13 publications

(8 citation statements)

References 44 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Undoubtedly Ebel's model 2 gives lower mean absolute differences compared with Görgl et al's model. 8 From the values in Table 2, it can be observed that the mean absolute differences range from 1 to 44% depending on the secondary target and the tube spectral distribution model used. However, these differences decrease with increase in operational voltage.…”

Section: Resultsmentioning

confidence: 99%

“…19 For these calculations, two models of tube spectral distributions were used, as described elsewhere. 2,8 Absorptions due to air paths and Kapton absorbers were also taken into account. The experimental and calculated K˛fluorescence intensities were next normalized to their corresponding values at 40 kV.…”

Section: Methodsmentioning

confidence: 99%

“…In particular, for XRF applications utilizing an x-ray tube as the primary excitation source, the development of FPA codes requires the use of an appropriate analytical expression for the tube's spectral distribution. These expressions can be obtained either from semiempirical descriptions of the x-ray tube spectrum, 1 -7 direct measurements 8,9 or parametric descriptions from indirect fluorescence measurements. 10 -12 Some of these expressions have been incorporated over the past few years in FPA algorithms, dealing mostly with direct tube-excited XRF analysis.…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Fundamental parameters approach in tube‐excited secondary target XRF set‐ups: comparison between theory and experiment

Zarkadas

Karydas

2004

X-Ray Spectrometry

View full text Add to dashboard Cite

Algorithms utilizing the fundamental parameters approach (FPA) can be applied for the calculation of sample fluorescence intensities in tube-excited secondary target x-ray fluorescence (STXRF) set-ups. The results of such calculations have recently been presented in the literature for different combinations of anode materials-secondary targets over a wide range of operational voltages. In this work, the accuracy of the FPA was thoroughly tested through the comparison of theoretical results with experimental data obtained by a series of measurements performed in an Mo anode tube-secondary target XRF assembly. The comparison shows that the FPA describes fairly accurately the dependence of experimental fluorescence intensities as a function of the operational voltage. However, the accuracy depends on the model used for the description of the tube spectral distribution and the position of the secondary target K-absorption edge with respect to the energy of the anode characteristic lines and the high-voltage cut-off limit. Furthermore, our experimental data indicate that the analytical models used in this work to reproduce the Mo anode emission spectra at different operational voltages predict rather unsatisfactorily the distribution of continuum radiation near the high-voltage cut-off limit. The methodology adopted in this work may be considered also as an indirect way for testing the validity of x-ray tube spectral distributions in certain energy regions.

show abstract

Section: Resultsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Fundamental parameters approach in tube‐excited secondary target XRF set‐ups: comparison between theory and experiment

Zarkadas

Karydas

2004

X-Ray Spectrometry

View full text Add to dashboard Cite

show abstract

“…A first evaluation of a measured Mo spectrum for presentation in photons s 1 sr 1 mA 1 keV 1 versus photon energy in keV is described. Further investigations by Görgl et al 47,48 deal with measured responses and the influence of different tube voltages and target materials on the measured spectra. Finally, Aiginger et al 49 measured spectral responses from Cr, Mo, Rh and W tubes and compared their results with measured spectra from Gilfrich 50 and with computed spectra from Schossmann's approach.…”

Section: Comparison To Other X-ray Tube Spectramentioning

confidence: 99%

X-ray tube spectra

Ebel

1999

X-Ray Spectrom.

View full text Add to dashboard Cite

X‐ray tube spectra make an essential contribution to the quantitative description of experimental setups or for quantitative x‐ray analysis. After an outline of the historical development of the description of tube spectra the approaches given by Wiederschwinger, Ebel et al. Schossmann et al. and Pella et al. are treated in detail. Summarizing the theoretical treatment and the applications, it can be stated that both approaches give comparable results over a certain spectral range. Pella's approach is restricted to electron incidence angles of 90° and application of Pella's spectral responses in the lower keV range should be avoided. Copyright © 1999 John Wiley & Sons, Ltd.

show abstract

“…Analytical descriptions of x-ray tube spectra have been widely reported in the literature. Some of them are the result of direct measurement of specific x-ray tubes, as described by Görgl and co-workers, 16,17 while others are considered as semi-empirical, like the models of Ebel and co-workers, 18 -21 and Pella et al 22,23 In order to investigate the extent to which the theoretical description of the secondary x-ray beam after a fluorescer target depends on the choice of the initial tube spectral distribution, we adopted in our calculations the use of all the three models mentioned above.…”

Section: Introductionmentioning

confidence: 99%

Theoretical study of a secondary target XRF setup at different operational tube voltages

Zarkadas¹,

Karydas²,

Paradellis³

2001

X-Ray Spectrometry

View full text Add to dashboard Cite

An algorithm was developed that allows a theoretical step-by-step study of secondary target XRF setups for different combinations of anode materials, secondary targets and operating tube voltages. By use of three different descriptions of x-ray tube spectral distributions, the qualitative and quantitative characteristics of the x-ray beam after the secondary target are examined. Calculations are presented for different combinations of anode material and secondary target such as Y-Mo, Mo-Mo, Rh-Mo and W-Mo. Additionally, universal functional relationships of the secondary target characteristic line intensities with respect to the operational voltage are presented. These relationships can be applied to any XRF setup that includes an x-ray diffraction tube and a secondary target.

show abstract

Energy‐dispersive measurement and comparison of different spectra from diffraction x‐ray tubes

Cited by 13 publications

References 44 publications

Fundamental parameters approach in tube‐excited secondary target XRF set‐ups: comparison between theory and experiment

Fundamental parameters approach in tube‐excited secondary target XRF set‐ups: comparison between theory and experiment

X-ray tube spectra

Theoretical study of a secondary target XRF setup at different operational tube voltages

Contact Info

Product

Resources

About