Encapsulated X-Ray Detector Enabled by All-Inorganic Lead-Free Perovskite Film With High Sensitivity and Low Detection Limit

Metal Halide Perovskites for X-ray Imaging Scintillators and Detectors

“…In comparison with the pristine crystal, Cs 2 AgBiBr 6 with a BiOBr epitaxial layer exhibited 5-fold higher resistivity, which helped to decrease the dark current and suppress the signal drift of the devices. Several other methods, such as additive assistance, post-treatment, liquid-nitrogen cooling, and A-site cation engineering (e.g., BA 2 CsAgBiBr 7 and CPA 4 AgBiBr 8 , CPA + = chloropropylammonium), were also employed to further improve the crystal quality. − In addition to single crystals, Cs 2 AgBiBr 6 films were used to fabricate X-ray detectors. , …”

“…216−220 In addition to single crystals, Cs 2 AgBiBr 6 films were used to fabricate X-ray detectors. 221,222 A 3 Bi 2 X 9 halide perovskites also have great potential for X-ray detection. The Yang group fabricated layered perovskite-like (NH 4 ) 3 Bi 2 I 9 single-crystal detectors, which showed unique anisotropic X-ray detection performance.…”

Terbium doped LiLuF4 nanocrystal scintillator-based flexible composite film for high resolution X-ray imaging

“…The detection limit of the material can be obtained by calculating the dose rate when the signal to noise ratio (SNR) is 3 : 1. 40,41 The detection limit of LiLuF 4 :15%Tb nanocrystals is 36.31 nGy s À1 , which is much lower than the requirement of X-ray diagnostics (5.50 mGy s À1 ).…”

Columnar Grain Growth of Lead-Free Double Perovskite Using Mist Deposition Method for Sensitive X-ray Detectors

“…4 Clearly, non-toxic Cs2AgBiBr6 shows great potential for X-ray detection applications. [22][23][24][25][26][27][28][29][30][31] However, polycrystalline Cs2AgBiBr6 thick films, which can be easily scaled up for imaging devices, have achieved a sensitivity of only up to 250 μC Gyair −1 cm −2 because of their high trap densities at grain boundaries. 27,28 Considering that it is difficult to prepare large single crystals and integrate them with readout circuits for imaging, a A Self-archived copy in Kyoto University Research Information Repository https://repository.kulib.kyoto-u.ac.jp fabrication process for high-quality polycrystalline Cs2AgBiBr6 thick films is required to realize highly sensitive X-ray imaging devices.…”

“…Although an exceptionally high sensitivity of 18,000 μC Gy air −1 cm −2 has been reported using Cs 2 AgBiBr 6 thin films, this result was obtained under conditions that facilitate high sensitivity, that is, extremely low dose rate (145.2 nGy air s −1 ) and high bias voltage (∼1667 V mm −1 ). 29 The formation of a columnar grain structure in the photoconductive layer is a promising solution to improve the sensitivity because a polycrystalline film composed of columnar grains has few grain boundaries across the direction of electron−hole pair collection. In fact, polycrystalline HgI 2 films with a columnar grain structure for X-ray detectors have shown excellent electrical properties, close to those of single crystals.…”