Enabling robust automotive electronic components in advanced CMOS nodes

Huard, V.; Mhira, S.; Cacho, F.; Bravaix, A.

doi:10.1016/j.microrel.2017.07.064

Cited by 3 publications

(1 citation statement)

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“…Thus, recent trends in technology node scaling and its effects on microelectronic reliability should be analyzed. nm [38] As indicated in the report from International Roadmap for Devices and Systems [39], the critical reliability issues for microelectronic devices in the near term (up to year 2024) are related to failures at the transistor-level. These issues include TDDB, BTI and HCI.…”

Section: Decrease In Devices' Operational Lifetime and Reliability Wimentioning

confidence: 99%

Pulsed laser scan methodology for single event effect (SEE) qualification

Chua¹

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This thesis addresses the need for alternative methods of single event effect (SEE) radiation testing in a period when microelectronic technology nodes are scaling to ever smaller dimensions. This results in increasingly complex devices and compels radiation test engineers to demand radiation test techniques which are capable of providing more information (both spatially and temporally) as compared to conventional broad beam heavy ion radiation test. Moreover, reliability and lifetime of advanced microelectronic devices are getting lower and thus, this thesis aims to study the influence of device ageing on its SEE radiation response. These issues are further complicated by demands As with every other exhilarating journey, mine started with an utterly unforeseen and casual conversation with a recognizable yet remote acquaintance. Such was the first day when I met up with my PhD supervisor, Prof Gan Chee Lip, in his office at Research Techno Plaza, Nanyang Technological University. Then, equipped with biomaterials knowledge and experience bequeathed through targeted modules from the School of Materials Science and Engineering, I was euphorically and fearlessly determined to engage in research for the betterment of mankind. Never did I envisage myself to be enchanted by the splendor of establishing radiation test methods to serve the community in Singapore; a decision that on hindsight, made impeccable sense and alignment with my core beliefs. At that time, this research domain was in its nascence in Singapore. The nation had just launched its first satellite a year ago while still trying to grapple with the uncertainties and challenges that gyrate around space research. Vast amount of knowledge and expertise had to be sought overseas; a blessing in which Dr Philippe Perdu from CNES France, was pivotal. My domain switch from biomaterials to microelectronics and space radiation would not have been possible without encouraging words, brilliant ideas, helping hands, generous sharing, sincere guidance, intense debates and discussions with many people along the way. Here forth, I would like to extend my heartfelt appreciation to these giants, whom one way or another, bigheartedly allowed me to look at this world, on top of their shoulders. Firstly, I would like to express my utmost gratitude towards Prof Gan Chee Lip for giving me the opportunity to be involved in such an ambitious and meaningful project. The road had been littered with steep learning curves, aggressive drafting of project and funding proposals, colossal amount of discussions with collaborators and numerous equipment to be purchased, set up and calibrated. He had provided me with the role model for scientific research, project management, student mentoring, collaborative engagements with both academia and industrial, conference organization and effective communication. He had given me plenty of room to grow, freedom to test ideas and conduct experiments, countless opportunities to participate in technical conferences and plentiful chances to exhibit our ...

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Section: Decrease In Devices' Operational Lifetime and Reliability Wimentioning

confidence: 99%