2020
DOI: 10.3390/nano10091709
|View full text |Cite
|
Sign up to set email alerts
|

Emulation of Biological Synapse Characteristics from Cu/AlN/TiN Conductive Bridge Random Access Memory

Abstract: Here, we present the synaptic characteristics of AlN-based conductive bridge random access memory (CBRAM) as a synaptic device for neuromorphic systems. Both non-volatile and volatile memory are observed by simply controlling the strength of the Cu filament inside the AlN film. For non-volatile switching induced by high compliance current (CC), good retention with a strong Cu metallic filament is verified. Low-resistance state (LRS) and high-resistance state (HRS) conduction follow metallic Ohmic and trap-assi… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

2
22
0

Year Published

2020
2020
2023
2023

Publication Types

Select...
9
1

Relationship

3
7

Authors

Journals

citations
Cited by 32 publications
(24 citation statements)
references
References 46 publications
2
22
0
Order By: Relevance
“…The extracted relaxation times suggest the successful emulation of the LTP effect since a long-lasting memory performance is achieved and is enhanced as we increase the number of the pre-synaptic signals [ 42 ]. From a physical point of view, we can argue that the formation of relatively big and robust CF that cannot self-rupture, in terms of effective diameter distribution, is the driving force for this effect [ 43 ].…”
Section: Resultsmentioning
confidence: 99%
“…The extracted relaxation times suggest the successful emulation of the LTP effect since a long-lasting memory performance is achieved and is enhanced as we increase the number of the pre-synaptic signals [ 42 ]. From a physical point of view, we can argue that the formation of relatively big and robust CF that cannot self-rupture, in terms of effective diameter distribution, is the driving force for this effect [ 43 ].…”
Section: Resultsmentioning
confidence: 99%
“…OxRRAM is based on the oxygen vacancy or ion migration, and CBRAM is based on the drift of metal ions within the switching layer by electrochemical reaction. Notably, compared with the OxRRAM, CBRAM with active metal electrodes (like Cu) behaves more advantageously for integrated circuits, such as reducing electron migration and RC delay [ 23 ].…”
Section: Introductionmentioning
confidence: 99%
“…Magnetoresistive randomaccess memory (MRAM) also shows resistance change by controlling the magnetization of magnetic material [6]. RRAM has the advantage of being capable of tunable resistive switching, which is applicable to the various application as storage memory [7][8][9][10][11][12][13][14][15][16][17][18][19][20], logicin-memory [21], and neuromorphic computing [22][23][24][25][26][27][28][29][30][31][32][33][34][35][36][37][38][39][40]. Moreover, RRAM shows lowpower operation, high endurance, good retention, high-density integration, and good complementary metal-oxide-semiconductor (CMOS) compatibility in terms of process and material.…”
Section: Introductionmentioning
confidence: 99%