2020
DOI: 10.3390/electronics9020304
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EMI Susceptibility of the Output Pin in CMOS Amplifiers

Abstract: Measurements in commercial devices demonstrate a considerable susceptibility of the operational amplifiers to the electromagnetic interferences coupled to their output pin. This paper investigates some basic architectures starting from single stage amplifiers up to a whole operational amplifier. The result is a correlation between the different amplifier configurations, the output impedance and the susceptibility to the interferences. The simulations are perfomed by using the standard CMOS UMC 180nm technology… Show more

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Cited by 3 publications
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