1991
DOI: 10.1109/15.99115
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EMI-induced failures in crystal oscillators

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Cited by 37 publications
(28 citation statements)
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“…4). As a Ph.D. student at the University of Toronto, Laurin (1991) [10] published a study of the effects of radio frequency perturbations on the oscillator circuits used in a Motorola 6809 processor. When placing an electric current loop close to the oscillator, he observed clock jitter, function losses in the microprocessor and data losses on the serial data bus.…”
Section: Early Work In Emc Of Integrated Circuitsmentioning
confidence: 99%
“…4). As a Ph.D. student at the University of Toronto, Laurin (1991) [10] published a study of the effects of radio frequency perturbations on the oscillator circuits used in a Motorola 6809 processor. When placing an electric current loop close to the oscillator, he observed clock jitter, function losses in the microprocessor and data losses on the serial data bus.…”
Section: Early Work In Emc Of Integrated Circuitsmentioning
confidence: 99%
“…Another important factor of great importance is high dynamic stability during temperature changes in the extended operating range. Use of switching circuits in many instances improves electrical circuit characteristics and/or compensates certain influences [27]- [32]. In this particular instance, it additionally improves the dynamic temperature stability.…”
Section: Introductionmentioning
confidence: 99%
“…Many research works [1][2][3][4][5][6][7][8][9][10][11][12][13] have exploited different crystal oscillator circuit architectures, which usually play the important role in improving EMI susceptibility, start-up, drive-level, and negative resistance dynamics of the crystal oscillator circuits. But they are expensive and exhibit inferior phase noise.…”
Section: Introductionmentioning
confidence: 99%