International Symposium on Electromagnetic Compatibility - EMC EUROPE 2012
DOI: 10.1109/emceurope.2012.6396739
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EMI comparison between Si and SiC technology in a boost converter

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Cited by 44 publications
(16 citation statements)
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“…While various filter options have been explored as a means of mitigating the EMI noise, an increased noise source caused by the WBG devices generally requires an increase in physical size of the EMI filters [5], [6]. This is not desirable in many applications, namely automotive and aerospace, where weight and size are critical design points.…”
Section: Introductionmentioning
confidence: 98%
“…While various filter options have been explored as a means of mitigating the EMI noise, an increased noise source caused by the WBG devices generally requires an increase in physical size of the EMI filters [5], [6]. This is not desirable in many applications, namely automotive and aerospace, where weight and size are critical design points.…”
Section: Introductionmentioning
confidence: 98%
“…This is a result of the increased dv/dt and di/dt transients, which lead to more noise production. To safely and reliably use these new converters at the higher switching speeds, some form of EMI mitigation is required, usually in the form of passive filters [8], [9]. Research has focused on the development of various EMI filters for power converters, both with Si components and WBG devices [10]- [12].…”
Section: Introductionmentioning
confidence: 99%
“…SiC Schottky barrier diode and MOSFET realize fast switching operation in high voltage power conversion circuits [1]. Fast high voltage switching and/or large current induces Electromagnetic cmpatibility (EMC) difficulties stemming from high dv=dt and di=dt [2]. The fast switching operation of one MOSFET in the bridge circuit is known to induce gate voltage fluctuations in the MOSFET on the other side.…”
Section: Introductionmentioning
confidence: 99%