Emergence of large thermal noise close to a temperature-driven metal-insulator transition

Chatterjee, Sudipta; Bisht, Ravindra Singh; Reddy, ‬V. Raghavendra; Raychaudhuri, A. K.

doi:10.1103/physrevb.104.155101

Cited by 9 publications

(3 citation statements)

References 63 publications

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“…However, thermal physics is incomprehensible. Many physical variables and phenomena, for instance reference [38], depend on the absolute temperature T and in the simplest possible case of classical statistics the dependence is just proportionality. Relatively more recent example, only a half century ago is the observation by Timko [39] a fundamental property of the silicon transistors that: 'if two identical transistors are operated at a constant ratio of collector current densities, r, then the difference in their base-emitter voltage is (k B T/q e )(ln r).…”

Section: Discussionmentioning

confidence: 99%

Set-up for observation thermal voltage noise and determination of absolute temperature and Boltzmann constant

Mishonov¹,

Serafimov²,

Petkov³

et al. 2022

Eur. J. Phys.

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We describe a set-up for measurement of the absolute zero by Johnson–Nyquist thermal noise which can be performed within a week in every high-school or university. Necessary electronic components and technical guidelines for the construction of this noise thermometer are given. The operating temperature used is in the tea cup range from ice to boiling water and in this sense the set-up can be given in the hands of every high school and university physics student. The measurement requires a standard multi-meter with thermocouple and voltage probe and gives excellent for education purposes percent accuracy. The explanation is oriented to university level but due to the simplicity of the explanation motivated high-school students can follow the explanation derivation of the used formulas for determination of the absolute zero and the Boltzmann constant. As a by-product our set-up gives a new method for the determination of the spectral density of the voltage e N and current noise i N of operational amplifiers.

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Section: Discussionmentioning

confidence: 99%

Set-up for observation thermal voltage noise and determination of absolute temperature and Boltzmann constant

Mishonov¹,

Serafimov²,

Petkov³

et al. 2022

Eur. J. Phys.

View full text Add to dashboard Cite

show abstract

“…Many physical variables and phenomena, for instance Ref. [38], depend on the absolute temperature T and in the simplest possible case of classical statistics the dependence is just proportionality. Relatively more recent example, only a half century ago is the observation by Timko [39] a fundamental property of the silicon transistors that: "if two identical transistors are operated at a constant ratio of collector current densities, r, then the difference in their base-emitter voltage is (k B T /q e )(ln r).…”

Section: Discussionmentioning

confidence: 99%

Set-up for observation thermal voltage noise and determination of absolute temperature and Boltzmann constant

Mishonov,

Serafimov,

Petkov

et al. 2022

Preprint

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“…In terms of resistance measurement by current injection as the signal component in THD, the THD represents the residual measured voltage by only removing the fundamental frequency in the frequency domain [ 14 ],

where

is the root-mean-square (RMS) of the measured fundamental voltage, and

is the measured RMS voltage at k- th harmonic voltage. Using Ohm’s law, the measured resistance is then expressed as

, where

is the Fourier transform of the given fundamental voltage signal,

, and current signal,

, in the time domain [ 15 ].…”

Section: Melt-resistive Sensor and Noise Reduction Hardware Under Hig...mentioning

confidence: 99%

On-Line Multi-Frequency Electrical Resistance Tomography (mfERT) Device for Crystalline Phase Imaging in High-Temperature Molten Oxide

Sejati

Saito

Prayitno

et al. 2022

Sensors

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An on-line multi-frequency electrical resistance tomography (mfERT) device with a melt-resistive sensor and noise reduction hardware has been proposed for crystalline phase imaging in high-temperature molten oxide. The melt-resistive sensor consists of eight electrodes made of platinum-rhodium (Pt-20mass%Rh) alloy covered by non-conductive aluminum oxide (Al2O3) to prevent an electrical short. The noise reduction hardware has been designed by two approaches: (1) total harmonic distortion (THD) for the robust multiplexer, and (2) a current injection frequency pair: low and high , for thermal noise compensation. THD is determined by a percentage evaluation of k-th harmonic distortions of ZnO at .1~10,000 Hz. The and are determined by the thermal noise behavior estimation at different temperatures. At 00 Hz, the THD percentage is relatively high and fluctuates; otherwise, THD dramatically declines, nearly reaching zero. At the determined 10,000 Hz and 1,000,000 Hz, thermal noise is significantly compensated. The on-line mfERT was tested in the experiments of a non-conductive Al2O3 rod dipped into conductive molten zinc-borate (60ZnO-40B2O3) at 1000~1200 C. As a result, the on-line mfERT is able to reconstruct the Al2O3 rod inclusion images in the high-temperature fields with low error, = 5.99%, at 1000 C, and an average error = 9.2%.

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Emergence of large thermal noise close to a temperature-driven metal-insulator transition

Cited by 9 publications

References 63 publications

Set-up for observation thermal voltage noise and determination of absolute temperature and Boltzmann constant

Set-up for observation thermal voltage noise and determination of absolute temperature and Boltzmann constant

Set-up for observation thermal voltage noise and determination of absolute temperature and Boltzmann constant

On-Line Multi-Frequency Electrical Resistance Tomography (mfERT) Device for Crystalline Phase Imaging in High-Temperature Molten Oxide

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