An on-line multi-frequency electrical resistance tomography (mfERT) device with a melt-resistive sensor and noise reduction hardware has been proposed for crystalline phase imaging in high-temperature molten oxide. The melt-resistive sensor consists of eight electrodes made of platinum-rhodium (Pt-20mass%Rh) alloy covered by non-conductive aluminum oxide (Al2O3) to prevent an electrical short. The noise reduction hardware has been designed by two approaches: (1) total harmonic distortion (THD) for the robust multiplexer, and (2) a current injection frequency pair: low and high , for thermal noise compensation. THD is determined by a percentage evaluation of k-th harmonic distortions of ZnO at .1~10,000 Hz. The and are determined by the thermal noise behavior estimation at different temperatures. At 00 Hz, the THD percentage is relatively high and fluctuates; otherwise, THD dramatically declines, nearly reaching zero. At the determined 10,000 Hz and 1,000,000 Hz, thermal noise is significantly compensated. The on-line mfERT was tested in the experiments of a non-conductive Al2O3 rod dipped into conductive molten zinc-borate (60ZnO-40B2O3) at 1000~1200 C. As a result, the on-line mfERT is able to reconstruct the Al2O3 rod inclusion images in the high-temperature fields with low error, = 5.99%, at 1000 C, and an average error = 9.2%.
This study investigates the in situ sludge thickness of polymers in a real-scale horizontal decanter centrifuge using the optimized particle resistance normalization (OPRN) technique. The sludge thickness of poly(methyl methacrylate) (PMMA) in an aqueous sodium chloride (NaCl) carrier fluid was observed as a function of the normalized particle resistance of a wireless electrical resistance detector. The measured resistance of the continuous phase during the centrifugation is set as the reference and normalized following its dominant frequency by Fourier transform. Here, the OPRN limits the particle resistance using the normalization function based on the closed-packing condition (i.e. Krieger 1972 Adv. Colloid Interface Sci. 3 111–36; Phillips
et al
1992 Phys. Fluids A 4 30–40; and Rao et al 2002 Int. J. Numer. Methods Fluids.
39 465–83) in the particle sensitivity area (PSA). The normalized value is then plotted in the fitting equation using a nonlinear generalized reduced gradient. The PSA is solved by a simulation study on electrostatics and by static experiments. Two different centrifugation parameters of feed rates and two centrifugal forces at four different measurement points were considered to observe the sludge thickness distribution as a function of operational time. As a result, the in situ sludge thickness is described in the nonlinear fit plot equation with a coefficient score to explain the separation phenomenon inside the decanter centrifuge. The plot agrees well with the experimental data with a high degree of coefficient of determination.
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