2008
DOI: 10.1108/03056120810896209
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Embedding and assembly of ultrathin chips in multilayer flex boards

Abstract: Purpose - The purpose of this paper is to present results from the EC funded project SHIFT (Smart High Integration Flex Technologies) on the embedding in and the assembly on flex substrates of ultrathin chips. Design/methodology/approach - Methods to embed chips in flex include flip-chip assembly and subsequent lamination, or the construction of a separate ultra-thin chip package (UTCP) using spin-on polyimides and thin-film metallisation technology. Thinning and separation of the chips is done using a "dicing… Show more

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Cited by 30 publications
(12 citation statements)
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“…Also, the die warpage can impede the shape recognition by the image-recognition system of the pick-and-place equipment. Currently, the industry relies on prototype equipment optimized to handle thin silicon, e.g., flip chip die bonders with adapted tooling and special release tapes [6,[20][21][22]. Temporary carriers may be used to support the thinned dice during assembly [23].…”
Section: Contact Methods For Ultrathin Die Packagingmentioning
confidence: 99%
“…Also, the die warpage can impede the shape recognition by the image-recognition system of the pick-and-place equipment. Currently, the industry relies on prototype equipment optimized to handle thin silicon, e.g., flip chip die bonders with adapted tooling and special release tapes [6,[20][21][22]. Temporary carriers may be used to support the thinned dice during assembly [23].…”
Section: Contact Methods For Ultrathin Die Packagingmentioning
confidence: 99%
“…Recently, a foil-based chip embedding technology was jointly developed by Holst Centre and imec [2], [3]. In contrast to fan-out WLP [4] and chip embedding in rigid or flexible printed circuit boards [5], [6], where cost reduction is achieved by scaling to larger panel sizes, low-cost was a main development goal of this chip embedding technology. The roll-to-roll compatible process flow starts by placing naked dies and thin passive components on a bare copper foil using anisotropic and isotropic conductive adhesive, respectively.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore it is critical that the strain in brittle device layers is reduced below the value at which cracking is initiated. Methods of reducing the strain experienced by device layers include preventing the propagation of cracks through the device layers through nano-patterning [7,8], reducing the strain in layers below the fracture limit of the material by patterning islands [9,10] or shifting the critical device layers closer to the neutral bending plane [11,12].…”
Section: Introductionmentioning
confidence: 99%