2005
DOI: 10.2116/analsci.21.763
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Elucidating a Particulate Matter Deposition Episode by Combining Scanning Electron Microscopy and X-Ray Fluorescence Spectrometry

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Cited by 2 publications
(2 citation statements)
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“…Wavelength dispersive X-ray fluorescence (WD-XRF) is a promising technique for environmental analysis and it has been reported as an alternative technique to monitor PM composition (Talebi, 1998;Vázquez et al, 2005). This technique allows the direct analysis of PM filters.…”
Section: Introductionmentioning
confidence: 99%
“…Wavelength dispersive X-ray fluorescence (WD-XRF) is a promising technique for environmental analysis and it has been reported as an alternative technique to monitor PM composition (Talebi, 1998;Vázquez et al, 2005). This technique allows the direct analysis of PM filters.…”
Section: Introductionmentioning
confidence: 99%
“…Lead and other toxic elements were found to be below WHO guidelines: however, the two cities are threatened by future high levels of air pollution due to the high rate of population growth and long term measurements are thought to be needed to monitor the expected deterioration. A combination of SEM and WDXRF was used by Vazquez et al 230 to measure multi-elemental composition and morphology of particulate matter samples to detect the presence of two potential pollutant emitters at four sites in the City of Campana, Argentina. A screening analysis was undertaken to explore similarities among sources and sample sites adopting the average concentration profile of the crustal rock as soil surrogate.…”
Section: Geological and Industrial Mineralsmentioning
confidence: 99%