2006
DOI: 10.1039/b611269m
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Atomic spectrometry update—X-ray fluorescence spectrometry

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Cited by 32 publications
(23 citation statements)
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References 391 publications
(344 reference statements)
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“…This technique is based on exciting the atoms in a material by applying an X-ray beam with appropriate energy and subsequent detection of the characteristic radiation emitted, which in turn is proportional to the concentration of atoms in the material [44]. XRF has many advantages, such as a simple and rapid procedure of analysis in a large number of samples, high sensitivity and low detection limits, enabling the determination of elements concentrations in trace and ultra-trace levels [45,46]. The XRF technique has some variations depending on, among others, excitation and detection setup [46].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…This technique is based on exciting the atoms in a material by applying an X-ray beam with appropriate energy and subsequent detection of the characteristic radiation emitted, which in turn is proportional to the concentration of atoms in the material [44]. XRF has many advantages, such as a simple and rapid procedure of analysis in a large number of samples, high sensitivity and low detection limits, enabling the determination of elements concentrations in trace and ultra-trace levels [45,46]. The XRF technique has some variations depending on, among others, excitation and detection setup [46].…”
Section: Introductionmentioning
confidence: 99%
“…XRF has many advantages, such as a simple and rapid procedure of analysis in a large number of samples, high sensitivity and low detection limits, enabling the determination of elements concentrations in trace and ultra-trace levels [45,46]. The XRF technique has some variations depending on, among others, excitation and detection setup [46]. Basically, if excitation is performed under small angles relative to the sample, the technique is called Total Reflection X-Ray Fluorescence (TXRF), if incident beam is too small (order of microns), the technique is called Micro-X Ray Fluorescence (μ-XRF).…”
Section: Introductionmentioning
confidence: 99%
“…No entanto, essas regiões podem ser correlacionadas com propriedades importantes para análise qualitativa ou mesmo quantitativa, quando os dados são tratados com quimiometria. 5,[17][18][19] Obtidos os espectros, realizou-se a atribuição dos picos, utilizando-se principalmente as energias associadas às linhas Ka, características de cada elemento químico. De forma geral, foram detectados quatro elementos comumente encontrados na matriz de garrafas PET: S, Fe, Cu e Sb.…”
Section: Resultsunclassified
“…A powerful method for investigating elemental composition and distribution is X-ray fluorescence spectroscopy (XRF) [88] and imaging (2D [79][80][81]89] and 3D [90]). Excellent spatial resolutions of 0.5-1 lm range for hard X-rays ([3 keV) and ca.…”
Section: Synchrotron X-raymentioning
confidence: 99%