“…Specifically, the problem of ellipse detection is often computationally demanding, since an ellipse is characterized by five parameters: center position coordinates; lengths of the major and minor axes; and the orientation of the major axis. Many wellstudied approaches have been used to address this problem: 1) probabilistic methods (see, for example, [8]), which attempt to obtain all five parameters while selectively sampling the image's edge data; 2) simulated annealing approaches (see, for example, [3]); and 3) multistage methods (see [13], [17], and [18]), which detect the parameters two or three at a time during each stage.…”