Elementary signals in ptychography

Silva, Júlio César da; Menzel, Andreas

doi:10.1364/oe.23.033812

Cited by 66 publications

(46 citation statements)

References 38 publications

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“…A scan trajectory with gradually varying row offsets was proposed for fly scan ptychography measurement [21], but it still fails to directly provide pixelated images. The overlap ratio has been reported to play a critical role in governing the obtained image quality in ptychography [27][28][29], however its impact on the periodic artifact has not been discussed yet. In this study, we explore the possibility to mitigate the periodic artifact in ptychography reconstruction while acquiring data following regular mesh patterns as in typical scanning probe microscopy measurements.…”

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Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy

Huang

Yan

et al. 2017

Applied Physics Letters

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We report our experiences with conducting ptychography simultaneously with Xray fluorescence measurement using the on-the-fly mode for efficient multi-modality imaging. We demonstrate that the periodic artifact inherent to the raster scan pattern can be mitigated using a sufficiently fine scan step size to provide an overlap ratio > 70%. This allows us to obtain transmitted absorption and phase contrast images with enhanced spatial resolution from ptychography while maintaining the fluorescence imaging with continuous-motion scans on pixelated grids. This capability will greatly improve the competence and throughput of scanning probe X-ray microscopy. Scanning probe X-ray microscopy is a powerful imaging method that simultaneously evokes multiple contrast mechanisms, including absorption, phase, fluorescence, diffraction and spectroscopy. These signals carry versatile information, and enable a suite of analytical tools to reveal a comprehensive view of the specimen under study. Correlative imaging using multiple contrast mechanisms simultaneously can significantly leverage the information obtained in the images. With the steady progress on fabricating high-resolution X-ray optics [1-5] and developing advanced microscopes [6-8], the achievable spatial resolution and detection sensitivity is continuously improving. Ptychography [9], as a scanning version of coherent diffraction imaging method, shares almost the same data acquisition scheme as a typical scanning probe microscope measurement, such as scanning X-ray transmission microscope (STXM) [10]. By scanning the specimen across a confined illumination

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confidence: 99%

Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy

Huang

Yan

et al. 2017

Applied Physics Letters

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“…We note that ptychography can be performed with reduced detector sampling, though at a cost of image fidelity (Edo et al, 2013) or of finer real-space sampling (Batey et al, 2014;da Silva & Menzel, 2015) which effectively corresponds to larger values of the overlap factor o discussed below. Achieving high resolution in ptychography requires the detection of scattering out to large angles, which is determined in part by the specimen's optical properties at the chosen X-ray wavelength and the number of photons N 0 used to illuminate each pixel (Glaeser, 1971;Sayre et al, 1977;Schropp & Schroer, 2010).…”

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confidence: 99%

Strategies for high-throughput focused-beam ptychography

Jacobsen

Deng

Nashed

2017

J Synchrotron Radiat

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X-ray ptychography is being utilized for a wide range of imaging experiments with a resolution beyond the limit of the X-ray optics used. Introducing a parameter for the ptychographic resolution gain G p (the ratio of the beam size over the achieved pixel size in the reconstructed image), strategies for data sampling and for increasing imaging throughput when the specimen is at the focus of an X-ray beam are considered. The tradeoffs between large and small illumination spots are examined.

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“…proposed in [46]. However, to the best of our knowledge, no optimal overlap ratio from theoretical point of view has been proposed yet.…”

Section: Influence Of the Overlap Ratiomentioning

confidence: 99%

Ptychography with multiple wavelength illumination

Wei

Urbach

2019

Opt. Express

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For performing phase retrieval in the extreme ultraviolet (EUV) regime more efficiently, developing polychromatic ptychography is desirable. As an alternative to the existing ptychographic information multiplexing (PIM) method, we present an another scheme where all monochromatic exit waves are expressed in terms of the amplitude of the transmission function and the thickness function of the object. Our proposed algorithm is a gradient based method and its validity is studied numerically. In addition, the sampling issue which appears in the polychromatic ptychography scheme and its influence to the reconstruction quality are discussed.

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Elementary signals in ptychography

Cited by 66 publications

References 38 publications

Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy

Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopy

Strategies for high-throughput focused-beam ptychography

Ptychography with multiple wavelength illumination

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