Elemental Analysis within the Electrical Double Layer Using Total Reflection X-ray Fluorescence Technique

Шаповалов, В. Л.; Ryskin, M.E.; Konovalov, Oleg; Hermelink, and Antje; Brezesinski, Gerald

doi:10.1021/jp066894c

Cited by 65 publications

(102 citation statements)

References 21 publications

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“…Although X-ray fluorescence has been used for detecting the number density of ions of similar systems by similar means, these either needed complicated data analysis [49] or were limited to providing the number density of ions relative to a known density of another ion at the interface [51]. We confirmed that the fluorescence technique below the critical angle provides a quick and reliable determination of the presence of ions, specifically, by identifying the characteristic emission lines of each element that fluoresce.…”

Section: Discussionsupporting

confidence: 60%

“…In the present study, we extended previous X-ray fluorescence techniques that had been used to determine the interfacial ion enrichment at charged monolayers [23,49,50,51,95,96,97] by tracing all emissions lines that can be resolved by our EDD. Although X-ray fluorescence has been used for detecting the number density of ions of similar systems by similar means, these either needed complicated data analysis [49] or were limited to providing the number density of ions relative to a known density of another ion at the interface [51].…”

Section: Discussionmentioning

confidence: 97%

“…Fluorescence is an ion-specific technique in that it can distinguish contributions from different ions because of their characteristic fluorescence spectra [51,96,97]. Since the X-ray penetration face.…”

Section: Experimental Setup and Methodsmentioning

confidence: 99%

“…Energy scans at fixed momentum transfer (dubbed resonant anomalous X-ray reflectivity in some literature) is a technique with an ability to yield specific ion distribution, as well as the dispersion corrections at the interface [48]. The near total X-ray reflection fluorescence, which make use of the characteristic emission line spectra of ions, is another common technique to determine ion adsorption specifically and quantitatively near the interface [49,50,51], yet it does not yield spatial information. The studies presented in this thesis utilize X-ray techniques to investigate the monovalent ions distribution near a highly charged LM surface.…”

Section: Motivation and Techniquesmentioning

confidence: 99%

“…The X-ray fluorescence near total reflection is another common technique to determine ion adsorption to charged Langmuir monolayers at the air/solution surface [23,49,50,51,95,96,97].…”

Section: Chapter 6 X-ray Fluorescence Spectroscopy From Ions At Charmentioning

confidence: 99%

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Ion distributions at charged aqueous surfaces: Synchrotron X-ray scattering studies

2009

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Section: Discussionsupporting

confidence: 60%

Section: Discussionmentioning

confidence: 97%

Section: Experimental Setup and Methodsmentioning

confidence: 99%

Section: Motivation and Techniquesmentioning

confidence: 99%

“…The X-ray fluorescence near total reflection is another common technique to determine ion adsorption to charged Langmuir monolayers at the air/solution surface [23,49,50,51,95,96,97].…”

Section: Chapter 6 X-ray Fluorescence Spectroscopy From Ions At Charmentioning

confidence: 99%

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Ion distributions at charged aqueous surfaces: Synchrotron X-ray scattering studies

2009

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X ‐Ray Diffraction and Spectroscopic Techniques for Liquid Surfaces and Interfaces

Vaknin

2012

Characterization of Materials

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X‐ray and neutron scattering techniques are probably the most effective tools when it comes to determining the structure of liquid interfaces on molecular‐length scales. These techniques are, in principle, not different from conventional x‐ray diffraction techniques that are commonly applied to three‐dimensional crystals, liquids, solid surfaces etc. However, special diffractometers and spectrometers that enable scattering from fixed horizontal surfaces are required to carry out the experiments. Indeed, systematic studies of liquid surfaces had not begun until the introduction of a dedicated liquid surface reflectometer. A basic property of a liquid‐vapor interface is the length scale over which the molecular density changes from the bulk value to that of the homogeneous gaseous medium. Inter molecular correlation and capillary waves, which depend on surface tension, gravity, and resolution that determines the length scale over which these correlations averaged, are among the most important factors that define the density profile across the interface and the planar correlations. In some instances the topmost layers of liquids are packed differently than in the bulk, giving rise to layering phenomena at the interface. Monolayers of compounds different than the liquid can be spread at the gas‐liquid interface (generally referred to as Langmuir monolayers). The spread compound might “wet” the liquid surface forming a film of homogeneous thickness or cluster to form an inhomogeneous rough surface. Two major diffraction techniques, complimenting one another, are used to determine interfacial structure. One is the x‐ray reflectivity (XR) technique which allows one to determine the electron density across such interfaces, from which the molecular density and the total thickness can be extracted. The other is the grazing angle x‐ray diffraction (GIXD) technique which is commonly used to obtain lateral arrangements and correlations of the topmost layers at interfaces. GIXD is especially efficient in cases where surface crystallization of the liquid or spread monolayers occurs. GIXD has been expanded to small angles (SA‐GIXD, or GI‐SAXS) for probing the structure of more complicated macromolecular systems, such as membrane proteins, and polymers. Diffuse x‐ray scattering (DXS) near the reflectivity line, which fall into the general GIXD category, are commonly to evaluate interfacial correlations, due to interfacial capillary waves, for instance. Both, XR and GIXD techniques provide structural information that is averaged over macroscopic areas, in contrast to scanning probe microscopies (SPMs), where local arrangements are probed. For an inhomogeneous interface, the reflectivity is an incoherent sum of reflectivities, accompanied by strong diffuse scattering, which, in general, is difficult to interpret definitively and often requires complementary techniques to support the x‐ray analysis. Therefore, whenever the objective of the experiment is not compromised, preparation of well‐defined homogeneous interfaces is a key to a more definitive and straightforward interpretation. The X‐ray fluorescence spectroscopy technique near total reflection from ion‐enriched liquid interfaces were developed at the same time as the diffraction techniques adding insight into ion adsorption and phenomena at liquid interfaces. The facile tunablility of photon energy at synchrotron x‐ray facilities enabled the extension of the fluorescence technique to obtain the near‐resonance surface x‐ray absorption spectroscopy (XANES) of specific interfacial ions. Photon energy tunability also facilitated the application of anomalous diffraction and spectroscopic methods commonly used for bulk materials. Anomalous XR, near edge energy scans at fixed momentum transfers have been implemented and used to determine ion distributions and ionic coordination at charged Langmuir monolayers and liquid‐liquid interfaces.

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The Interaction between Soft Interfaces: Forces and Structural Aspects

Schneck

2016

Adv Materials Inter

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Soft interfaces constituted by two-dimensional molecular layers play important roles in numerous technological applications and are major components of all biological matter, for example in the form of biomembranes. The mutual interaction between such interfaces often crucially influences their function as well as the structural organization of the entities they form. The forces acting between two soft interfaces in liquids not only depend on their chemical properties, like charge density or hydrophilicity. They are often also closely connected to the structural response of the interfaces to their interaction, for instance in terms of molecular conformations or ion distributions. This interplay renders the description of the interaction between soft or chemically complex interfaces challenging. In the present article, various experimental and theoretical approaches to the study of interacting soft interfaces are reviewed with a focus on structural aspects

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Elemental Analysis within the Electrical Double Layer Using Total Reflection X-ray Fluorescence Technique

Cited by 65 publications

References 21 publications

Ion distributions at charged aqueous surfaces: Synchrotron X-ray scattering studies

Ion distributions at charged aqueous surfaces: Synchrotron X-ray scattering studies

X ‐Ray Diffraction and Spectroscopic Techniques for Liquid Surfaces and Interfaces

The Interaction between Soft Interfaces: Forces and Structural Aspects

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