Characterization of Materials 2012
DOI: 10.1002/0471266965.com077.pub2
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X ‐Ray Diffraction and Spectroscopic Techniques for Liquid Surfaces and Interfaces

Abstract: X‐ray and neutron scattering techniques are probably the most effective tools when it comes to determining the structure of liquid interfaces on molecular‐length scales. These techniques are, in principle, not different from conventional x‐ray diffraction techniques that are commonly applied to three‐dimensional crystals, liquids, solid surfaces etc. However, special diffractometers and spectrometers that enable scattering from fixed horizontal surfaces are required to carry out the experiments. Indeed, system… Show more

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Cited by 21 publications
(46 citation statements)
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“…2(a). The R/R F profile from the salt solution surface resembles that of an air-water interface where R/R F ∼ exp(−ξ 2 Q 2 z ), and ξ is a measure of the instrumental resolution-dependent interfacial roughness [17,26,27]. In the presence of PEG-AuNPs in solutions, the R/R F profile dramatically changes, showing a clear interference pattern that is characteristic of a highly uniform film at the interface.…”
Section: Resultsmentioning
confidence: 99%
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“…2(a). The R/R F profile from the salt solution surface resembles that of an air-water interface where R/R F ∼ exp(−ξ 2 Q 2 z ), and ξ is a measure of the instrumental resolution-dependent interfacial roughness [17,26,27]. In the presence of PEG-AuNPs in solutions, the R/R F profile dramatically changes, showing a clear interference pattern that is characteristic of a highly uniform film at the interface.…”
Section: Resultsmentioning
confidence: 99%
“…Quantitatively, we determine the electron-density profile across the interfaces, ρ(z), with finer structural details, that yields the best fit to the measured 076002-2 reflectivity. The ED profiles are generated by refinement of the effective-density model [28] by calculating the reflectivity with the Parratt recursion formalism [17,26,27]. Figure 2(b) shows the optimal ED profiles that best fit the R/R F data presented in Fig.…”
Section: Resultsmentioning
confidence: 99%
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