1969
DOI: 10.1007/978-3-642-92986-1
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Elektronenmikroskopische Methodik

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Cited by 52 publications
(5 citation statements)
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“…For this purpose, an electron diffraction pattern of a standard sample was obtained by the procedure described in ref. [62] under the conditions used for the examined samples.…”
Section: Methodsmentioning
confidence: 99%
“…For this purpose, an electron diffraction pattern of a standard sample was obtained by the procedure described in ref. [62] under the conditions used for the examined samples.…”
Section: Methodsmentioning
confidence: 99%
“…Samples 1 and 2 were obtained by chemical vapor deposition with thermal decomposition of silane, whereas sample 3 was obtained by vacuum evaporation in a diffusion pumped system using an electron beam gun. The size of the coherently scattering regions near the surface was obtained by means of reflection electron diffraction (7). The geometrical film thickness was measured with a Perthen stylus tracer Model ECW-L.…”
Section: Methodsmentioning
confidence: 99%
“…Samples were prepared [56] by the method of spraying tested solution on a substrate by means of the ultrasonic dispersant UZDN-1A (Ukrrospribor Ltd, Ukraine), which allows obtaining a uniform coating substrates. A thin amorphous carbon film deposited on a copper grid was used as a substrate.…”
Section: Transmission (Tem) and Scanning (Sem) Electron Microscopymentioning
confidence: 99%