1981
DOI: 10.1002/pssb.2221030216
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Electroreflectance of InN Semimetallic Thin Films

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Cited by 22 publications
(21 citation statements)
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“…The experimental results in Fig. 3 clearly show a large increase of the e ective mass with increasing electron concentration [19][20][21][22][23][24]. The results are reasonably well described by Eqs.…”
Section: Electronic Properties Of Innsupporting
confidence: 55%
“…The experimental results in Fig. 3 clearly show a large increase of the e ective mass with increasing electron concentration [19][20][21][22][23][24]. The results are reasonably well described by Eqs.…”
Section: Electronic Properties Of Innsupporting
confidence: 55%
“…The mass was found to be 0.11 (the mass is given in units of the free-electron mass) in the samples grown earlier [29,30]. The value was also supported by theory [31,32].…”
Section: Physical Constantsmentioning
confidence: 83%
“…6) However, other studies reported values ranging from 1.7 to 3.1 eV. 3,[7][8][9][10][11] The most commonly cited measurement on optical absorption is that of Tansley and Foley;12) they reported band gap energy of 1.89 eV at room temperature.…”
Section: Introductionmentioning
confidence: 99%