Journal of Crystal Growth
 1987
DOI: 10.1016/0022-0248(87)90236-3
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Electrooptic measurement of the volume resistivity of bismuth silicon oxide (Bi12SiO20)

David A. Seery
1
,
M. H. Garrett
2
,
Armand R. Tanguay
3
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Cited by 8 publications
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