2012
DOI: 10.1103/physrevb.86.085428
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Electronic transition from graphite to graphene via controlled movement of the top layer with scanning tunneling microscopy

Abstract: A series of measurements using a technique called electrostatic-manipulation scanning tunneling microscopy (EM-STM) were performed on a highly-oriented pyrolytic graphite surface. The electrostatic interaction between the STM tip and the sample can be tuned to produce both reversible and irreversible large-scale movement of the graphite surface. Under this influence, atomic-resolution STM images reveal that a continuous electronic transition from triangular symmetry, where only alternate atoms are imaged, to h… Show more

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Cited by 27 publications
(28 citation statements)
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References 40 publications
(41 reference statements)
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“…Our experiments did not show a specific trend in the moving probability as a function of the tip voltage (while keeping the tip-sample distance constant). This observation rules out electrostatic effects as the triggering factor of the sliding motion, as was reported in electrostatic manipulation STM (EM-STM) experiments [36,37]. This is further confirmed by the observation of non-directional WS 2 sliding triggered by an AFM probe.…”
Section: Ws 2 Sliding Triggered By a Scanning Probe Microscopy (Spm) Tipsupporting
confidence: 84%
“…Our experiments did not show a specific trend in the moving probability as a function of the tip voltage (while keeping the tip-sample distance constant). This observation rules out electrostatic effects as the triggering factor of the sliding motion, as was reported in electrostatic manipulation STM (EM-STM) experiments [36,37]. This is further confirmed by the observation of non-directional WS 2 sliding triggered by an AFM probe.…”
Section: Ws 2 Sliding Triggered By a Scanning Probe Microscopy (Spm) Tipsupporting
confidence: 84%
“…Since carbon atoms in an AA stack have higher energy as compared to the one for the AB stack we expect larger amplitude in AA stacked region [41]…”
Section: Resultsmentioning
confidence: 98%
“…This lateral displacement is expected due to the weak van der Waals force between the two graphene layers 25 26 . There is extensive evidence in the literature that lateral displacement of graphene layers with respect to each other takes place in various types of scanning probe microscopies 27 28 29 30 31 32 33 34 35 36 . The relative displacement of a single graphene layer on another graphene layer is even more likely when accompanied by deformation of the layers 37 .…”
Section: Resultsmentioning
confidence: 99%