2014
DOI: 10.1021/cm5025074
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Electronic Structure of Monoclinic BiVO4

Abstract: Figure S1. XRD of CVD grown BiVO 4 (black) thin film grown on FTO coated glass substrate. Also provided are reference peaks of FTO and monoclinic scheelite (ms) BiVO 4 .

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Cited by 372 publications
(416 citation statements)
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“…23 Furthermore, these findings are consistent with the model of Van de Walle,48 in which the character of the H int defect is defined by the position of the Fermi level with respect to the universal hydrogen level, which is at the same energy as an electron in the standard hydrogen electrode (SHE). In the case of BiVO 4 , for which the CBM energy is 0.1 -0.3 eV below SHE, 6,16 interstitial hydrogen should act as a donor, as observed in our experiments. The higher carrier concentration created by H 2 annealing can also explain the improved PEC performance presented in Fig.…”
supporting
confidence: 81%
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“…23 Furthermore, these findings are consistent with the model of Van de Walle,48 in which the character of the H int defect is defined by the position of the Fermi level with respect to the universal hydrogen level, which is at the same energy as an electron in the standard hydrogen electrode (SHE). In the case of BiVO 4 , for which the CBM energy is 0.1 -0.3 eV below SHE, 6,16 interstitial hydrogen should act as a donor, as observed in our experiments. The higher carrier concentration created by H 2 annealing can also explain the improved PEC performance presented in Fig.…”
supporting
confidence: 81%
“…Therefore, we consider the possibility that this absorption increase is due to d-d transitions of V 4+ (3d 1 ), which should have transition energies in the range of 1 -2 eV. 6,37 It is now well established that electron small polarons in BiVO 4 are energetically favoured over delocalized electrons in the conduction band. [10][11][12] Such electron small polarons localize at V sites, leading to a change of formal oxidation state from V 5+ (3d 0 ) to V 4+ (3d 1 ), the concentration of which will increase with increasing electron polaron concentration.…”
Section: Optical and Electronic Properties Of Hydrogen-treated Bivomentioning
confidence: 99%
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“…[3,5] It has a moderate bandgap of 2.5 eV and an energetically low-lying valence band position. [6,7] However, it suffers from exceptionally small majority carrier mobilities due to formation of electron small polarons, [8][9][10] photochemical instabilities associated with localization of holes near its surface, [11] and relatively slow injection of holes across the semiconductor/electrolyte interface. While incorporation of a catalyst on the surface can improve stability and increase OER activity, reducing photocarrier recombination in the material calls for strategies to promote physical charge separation and electron extraction.…”
Section: Introductionmentioning
confidence: 99%