Electronic structure of InN studied using soft x-ray emission, soft x-ray absorption, and quasiparticle band structure calculations

An XANES and XES investigation of the electronic structure of indium rich InxGa1−xN films

“…Thus, considering the results in [21], where the existence of an electron accumulation layer at the InN surface was quantitatively confirmed, we hypothesize that the screening of the core-hole potential for InN is more effective due to the extra free surface electrons, which does not appear to be the case for the In 0.23 Ga 0.77 N film. Additionally, in [22] a notable difference between the X-ray absorption edge onsets for the total fluorescence yield (TFY, which is bulk sensitive) and the TEY modes was observed for nitrogen K edge of InN. The onsets were found to occur at approximately 0.8 eV and 1.4 eV above the valence band maximum, respectively.…”

Ab‐initio theory of semiconductor band structures: New developments and progress

“…Figure 10 shows X-ray absorption spectra (XAS) of w-InN recorded in the total electron yield (TEY) mode for two different incident angles 20° and 70° with respect to the c-axis of the hexagonal crystal [92]. For light polarization perpendicular to the c-axis (the z-axis), transitions from N 1s initial states into the N 2p z -states are dipole forbidden.…”

“…Adopted from [79]. Figure 10 X-ray absorption spectra (solid line) taken in the total electron yield mode for the N K-edge and incidence angles of (a) 20° and (b) 70° with respect to the c-axis of w-InN [92]. They are compared with calculated unoccupied partial densities of states (thin black lines/shaded areas) projected onto N 2p z -states or N 2p x,y -states.…”

X-ray absorption spectra of InxGa1−xN alloys with insight from atom-specific simulations

“…Initial N -edge studies [12][13][14][15][16] focused on InN and especially on an introductory comparison between experimental spectra and simulations. A XANES and x-ray emission study of In x Ga 1−x N epilayers for x < 0.55 has been recently reported; 17 although the overall spectral features are consistent with expectations, for samples with x = 0.23 and x = 0.53 the N -edge spectra exhibited limited linear dichroism, indicating heterogeneity, confirmed by the authors by x-ray diffraction techniques.…”

“…In some previous reports, [12][13][14]17 electron yield detection was employed, which is known to be very surface sensitive, so that the spectra might reflect the properties of the surface rather than the bulk; in another case, 15 fluorescence yield was adopted, but no details on correction for self-absorption effects, certainly present since N constitutes half the atomic composition of the sample, were provided.…”