Heterojunction Si solar cells exhibit notable performance degradation. This is a substantial challenge for their market acceptance and for basic science. In order to shed light to the underlying causes, we studied this problem by layering several techniques on top of each other in order to determine the dynamics of electronic defect generation. The first layer of our method is adapting LAMMPS Molecular Dynamics simulations to create aSi/cSi stacks. Our simulations use femtosecond time-steps. For the interatomic potential, we used the Artificial-Intelligence-based GAP interatomic potential. Next, we optimized these stacks with Density Functional calculations. This was followed by creating localized structural defects in the stacks by local heat blasting. We then analyzed the just-generated structural defects by the Inverse Participation Ratio (IPR) method to identify which structural defects induced and supported electronic defects. Next, we adapted the Nudged Elastic Band (NEB) method to determine the energy barriers that control the formation of these electronic defects. We performed the NEB method for thousands of electronic defects to determine the distributions of these energy barriers. Finally, we developed an Accelerated Superbasin Kinetic Monte Carlo approach to determine the time dependence of the electronic defect generation, as controlled by this energy barrier distribution. The determination of the energy barriers out to 4 eV enabled us to determine the defect generation out to Gigaseconds, or of the order of 10 years. Our method is thus capable of connecting physical processes from femtoseconds to Gigaseconds. Our main conclusions are that even in dark conditions, thermal activation processes lead to a substantial increase of the electronic defect density. Further, we also simulated the same processes at the accelerated testing temperature of 350K, and established a quantitative relationship between the regular and accelerated defect generation, thus making accelerated testing a more quantitative assessment tool.