2022
DOI: 10.1016/j.jallcom.2022.164928
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Electronic reconstruction induced inverted hysteresis loop in La0.67Sr0.33MnO3/Pb(Zr0.52Ti0.48)O3 superlattices

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Cited by 8 publications
(9 citation statements)
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“…The modulation period can be calculated from the characteristic satellite peaks using the standard formula: Λ = λ Cu Kα / 2(sin θ m+1 − sin θ m ), where λ Cu Kα is the wavelength of Cu K α radiation and m and m + 1 refer to the two nearest satellite peaks. 18 The modulation period of [PZT 18 /STO 3 ] 7 superlattices is calculated to be about 84 Å, which is in agreement with the thickness of a stacked PZT/STO bilayer. According to the position of the main peaks, the average out-of-plane lattice parameter (c av ) of the PZT m /STO 3 superlattices can be calculated, and the results are shown in Figure 1c.…”
Section: ■ Results and Discussionsupporting
confidence: 67%
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“…The modulation period can be calculated from the characteristic satellite peaks using the standard formula: Λ = λ Cu Kα / 2(sin θ m+1 − sin θ m ), where λ Cu Kα is the wavelength of Cu K α radiation and m and m + 1 refer to the two nearest satellite peaks. 18 The modulation period of [PZT 18 /STO 3 ] 7 superlattices is calculated to be about 84 Å, which is in agreement with the thickness of a stacked PZT/STO bilayer. According to the position of the main peaks, the average out-of-plane lattice parameter (c av ) of the PZT m /STO 3 superlattices can be calculated, and the results are shown in Figure 1c.…”
Section: ■ Results and Discussionsupporting
confidence: 67%
“…The XRD patterns for the [PZT m /STO 3 ] n superlattices show that the main peaks (labeled as “0”) accompanied by characteristic satellite peaks (labeled as “±1”, “±2”) are close to the (002) diffraction peaks of the substrate, indicating that the superlattice with a periodic structure has epitaxially grown on the LSMO/STO substrate. The modulation period can be calculated from the characteristic satellite peaks using the standard formula: Λ = λ Cu Kα /2­(sin θ m +1 – sin θ m ), where λ Cu Kα is the wavelength of Cu K α radiation and m and m + 1 refer to the two nearest satellite peaks . The modulation period of [PZT 18 /STO 3 ] 7 superlattices is calculated to be about 84 Å, which is in agreement with the thickness of a stacked PZT/STO bilayer.…”
Section: Resultsmentioning
confidence: 55%
“…Although the peak of SAO is not obvious at the XRD pattern of STO/SAO/(LCMO/SRO) 4 , it can be seen from Figure S2 of the Supporting Information that the out-of-plane lattice parameter of SAO is 16.010 Å, which is close to the value reported in previous literature. , The appearance of higher order strong satellite peaks (denoted as ±1, ±2, ...) around the (002) main peak (described as “0”) in three SLs clearly indicates the formation of the SL structure with periodic modulated components. , The surface morphology shown in Figure S3 of the Supporting Information, with a root square roughness of less than 0.5 nm, can further confirm the good crystalline quality of the sample. The modulation thickness Λ can be calculated from the satellite peak positions using the formula Λ = λ/2­(sin θ i +1 – sin θ i ), , where λ is the wavelength of Cu Kα radiation (0.15407 nm) and θ i and θ i +1 are the angular positions of the i th- and ( i + 1)­th-order satellite peaks, respectively. The calculated Λ of STO/(LCMO/SRO) 4 , STO/SAO/(LCMO/SRO) 4 , and freestanding (LCMO/SRO) 4 SLs is about 13.5 ± 0.1 nm, which is consistent with our expected value.…”
Section: Results and Discussionmentioning
confidence: 99%
“…[ 14–16 ] Meanwhile, the varied lattice orientation of substrates also can provide different interfacial strain conditions such as uniaxial or biaxial stress for epitaxial overlayer. [ 13,17–19 ]…”
Section: Introductionmentioning
confidence: 99%
“…[14][15][16] Meanwhile, the varied lattice orientation of substrates also can provide different interfacial strain conditions such as uniaxial or biaxial stress for epitaxial overlayer. [13,[17][18][19] In this study, we have fabricated the single-crystalline LSMO films with different orientations and investigated the evolution of magnetic domain structures as a function of the lattice orientation. Magnetic force microscopy (MFM) with an external in-plane field was used to observe the evolution of magnetic domain structure at room temperature.…”
Section: Introductionmentioning
confidence: 99%