2016
DOI: 10.1016/j.physrep.2015.11.002
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Electronic properties of hafnium oxide: A contribution from defects and traps

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Cited by 152 publications
(104 citation statements)
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“…Experimentally, there is a well characterized 2.7 eV photoluminescence peak 24,25 associated with a 5.2 eV absorption peak. The optical transitions for all five charge states of the oxygen vacancy in m-HfO 2 were calculated in a DFT study using both periodic and embedded cluster methods and Time-dependent DFT (TD-DFT) for calculating optical transition energies.…”
Section: Figmentioning
confidence: 99%
“…Experimentally, there is a well characterized 2.7 eV photoluminescence peak 24,25 associated with a 5.2 eV absorption peak. The optical transitions for all five charge states of the oxygen vacancy in m-HfO 2 were calculated in a DFT study using both periodic and embedded cluster methods and Time-dependent DFT (TD-DFT) for calculating optical transition energies.…”
Section: Figmentioning
confidence: 99%
“…Hafnium and zirconium oxides are well-known high-κ materials (≈ 30 for HfO2, ≈ 25 for ZrO2), 1 useful for MOSFETs and memory devices. 2 Due to their high electrical resistivity, these oxides could prove useful also in all-solid-state lithium-ion batteries as electrolyte materials. However, electrolyte materials are also required to have a high enough lithium-ion conductivity to be useful.…”
Section: Introductionmentioning
confidence: 99%
“…In a MOSFET or ReRAM device, HfO x films can-depending on the processing procedures-be either crystalline or amorphous, and hence it is necessary to understand ion transport in both phases and to elucidate the similarities and differences in behavior. Ion transport, in contrast to electronic transport, 1 in HfO x has only been examined in a few publications, however (in crystalline phases [2][3][4][5] and in the amorphous state [6][7][8][9], and no general picture of the behavior has as yet emerged.…”
Section: Introductionmentioning
confidence: 99%