2006
DOI: 10.1007/s10825-006-0048-z
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Electron transport in self-switching nano-diodes

Abstract: By using a two dimensional ensemble MonteCarlo (2D EMC) method, the behavior of electrons transporting through asymmetric nano-wires, referred to as self-switching nano-diodes (SSDs), is studied. Our numerical results show that the diode-like characteristic is an intrinsic property of the geometric asymmetry in the nanometer scale and the surface states originated from the fabricating processes results in the presence of the threshold voltages.

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Cited by 9 publications
(6 citation statements)
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References 10 publications
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“…With the aim of determining the SSD I-V characteristics, we employed a physically-based device simulator in two-dimensional mode, similar to that reported for 2DEG-based InGaAs SSD and silicon-on-insulator structures. 3,9,17) The electrical properties of 2DEG samples utilized in the simulation were: background doping n = 1 × 10 17 cm −3 , electron mobility μ = 12,000 cm 2 V −1 s −1 , with no impurity scattering. Unless otherwise stated, the dielectric in grooves was considered to be air (ε r = 1) thus inducing a surface charge density of n s = 0.4 × 10 12 cm −2 .…”
Section: Geometry Parameters and Simulation Methodsmentioning
confidence: 99%
“…With the aim of determining the SSD I-V characteristics, we employed a physically-based device simulator in two-dimensional mode, similar to that reported for 2DEG-based InGaAs SSD and silicon-on-insulator structures. 3,9,17) The electrical properties of 2DEG samples utilized in the simulation were: background doping n = 1 × 10 17 cm −3 , electron mobility μ = 12,000 cm 2 V −1 s −1 , with no impurity scattering. Unless otherwise stated, the dielectric in grooves was considered to be air (ε r = 1) thus inducing a surface charge density of n s = 0.4 × 10 12 cm −2 .…”
Section: Geometry Parameters and Simulation Methodsmentioning
confidence: 99%
“…With the aim of determining the SSD current-voltage behavior (I-V), we employed a commercial physically based device simulator in two-dimensional mode, similar to that reported for 2DEG-based InGaAs SSD and silicon-oninsulator structures [23,30,31]. In this model, only the 2DEG layer geometry resulted after the lithography process is analyzed.…”
Section: (A)mentioning
confidence: 99%
“…As a first approach, we use a twodimensional model as that reported for 2DEG-based InGaAs SSD 8,23 and SOI 16 structures. The analysis was performed on InAlAs/InGaAs heterostructures whose layered sequence is described by Song et al 15 Numerical simulations were run (at room-temperature) by introducing a background doping n = 1x10 17 cm −3 , an electron mobility µ = 12000 cm 2 /Vs and the impurity scattering set to off.…”
Section: Simulation and Analysis Detailsmentioning
confidence: 99%