1972
DOI: 10.1088/0022-3727/5/4/313
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Electron transport, attachment and ionization in c-C4F8 and iso-C4F8

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Cited by 33 publications
(34 citation statements)
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“…Novak and Fréchette 11 and Itoh et al 38 arrived at similar estimates of the MTCS based on electron swarm measurements. 25 The MTCS of Itoh et al has constant values of 80ϫ10 Ϫ16 cm 2 below 4 eV and 14ϫ10 Ϫ16 cm 2 above 11 eV, with a smooth interpolation in between, and is thus much larger than the present MTCS at low energy and much smaller at high energy.…”
Section: Resultscontrasting
confidence: 53%
See 1 more Smart Citation
“…Novak and Fréchette 11 and Itoh et al 38 arrived at similar estimates of the MTCS based on electron swarm measurements. 25 The MTCS of Itoh et al has constant values of 80ϫ10 Ϫ16 cm 2 below 4 eV and 14ϫ10 Ϫ16 cm 2 above 11 eV, with a smooth interpolation in between, and is thus much larger than the present MTCS at low energy and much smaller at high energy.…”
Section: Resultscontrasting
confidence: 53%
“…At higher energies, several resonant peaks are observed in dissociative attachment, with F Ϫ being by far the principal ionic fragment produced, 5 although larger anions are also formed. Swarm parameters ͑drift velocities and ionization and attachment coefficients͒ were measured by Naidu et al 25 Yamaji et al 26 have also carried out swarm measurements on dilute mixtures of c-C 4 F 8 in argon.…”
Section: Introductionmentioning
confidence: 99%
“…One possible explanation for this effect has been provided by Hunter et al [16] who, in their study of 1-C 3 F 6 found the electron attachment rate constant anomalously dependent on gas pressure, and established the hypothesis of temporary resonant trapping of the electrons via excited dimer ions. Even though Naidu et al [17] did not report any particular dependence of v e with pressure, they did observe a marked pressure dependence in the ratio of the electron diffusion to mobility coefficient D/K e , this difference being enhanced for E/N > 360 Td, which although indirectly, would suggest some pressure dependence of v e . Moreover, below this value, both curves merge into a single one.…”
Section: Electron Transport In C-c 4 Fmentioning
confidence: 82%
“…The percentage decreases with increasing field. All calculations presented below were performed for the value 2.8 x 10-15 cm z • Figure 3 shows a comparison be-0 / Naidu et al [37]. Solid lines show present calculations.…”
Section: Ionizaton (A) and Attachment ( N ) Coefficients Of Cclzfzmentioning
confidence: 99%